Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.357803
Title: Dependence of charging on crystallographic orientations of an as-grown α-quartz
Authors: Gong, H. 
Taijing, L. 
Ong, C.K. 
Issue Date: 1994
Source: Gong, H., Taijing, L., Ong, C.K. (1994). Dependence of charging on crystallographic orientations of an as-grown α-quartz. Journal of Applied Physics 76 (2) : 1352-1354. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357803
Abstract: The scanning electron microscope copper-detector technique introduced most recently by H. Gong and C. K. Ong [J. Appl. Phys. 75, 449 (1994)] is employed for the investigation of charging on faces m {101̄0}, R {101̄1}, and χ {516̄1} of single-crystalline α-quartz. It is found that the charging ability decreases in the order of m, R, and χ, revealing the dependence of charging on crystallographic orientations, and these results are confirmed by the well-established mirror-image method. In addition, the experimental results also suggest that not only electron-irradiation-induced defects but also intrinsic defects are responsible for charge trapping.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/96168
ISSN: 00218979
DOI: 10.1063/1.357803
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