Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.357803
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dc.titleDependence of charging on crystallographic orientations of an as-grown α-quartz
dc.contributor.authorGong, H.
dc.contributor.authorTaijing, L.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:20:20Z
dc.date.available2014-10-16T09:20:20Z
dc.date.issued1994
dc.identifier.citationGong, H., Taijing, L., Ong, C.K. (1994). Dependence of charging on crystallographic orientations of an as-grown α-quartz. Journal of Applied Physics 76 (2) : 1352-1354. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357803
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96168
dc.description.abstractThe scanning electron microscope copper-detector technique introduced most recently by H. Gong and C. K. Ong [J. Appl. Phys. 75, 449 (1994)] is employed for the investigation of charging on faces m {101̄0}, R {101̄1}, and χ {516̄1} of single-crystalline α-quartz. It is found that the charging ability decreases in the order of m, R, and χ, revealing the dependence of charging on crystallographic orientations, and these results are confirmed by the well-established mirror-image method. In addition, the experimental results also suggest that not only electron-irradiation-induced defects but also intrinsic defects are responsible for charge trapping.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.357803
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.357803
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume76
dc.description.issue2
dc.description.page1352-1354
dc.identifier.isiutA1994NX40000116
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