1. ScholarBank@NUS

Wong Wai Kin

rp08362

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Wong Wai Kin
(not current staff)
Variants
Wong, W.-K.
KIN, WONG WAI
Wong, W.K.
Wong, W.
 
Main Affiliation
 
Faculty
 
Email
elewwk@nus.edu.sg
 
Other emails
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Department:  ELECTRICAL & COMPUTER ENGINEERING

Results 1-20 of 24 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1200712.9MHz Lame-mode differential SOI bulk resonatorsKhine, L.; Palaniapan, M. ; Wong, W.-K. 
220076MHz bulk-mode resonator-with Q values exceeding one millionKhine, L.; Palaniapan, M. ; Wong, W.-K. 
32009Acoustic phonon characterisation of fixed-fixed beam MEMS switchAnnamalai, M.; Palaniapan, M. ; Wong, W.-K. 
42006Carbon nanostructures as interconnect and interface materialsDe Asis, E.; Ngo, Q.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
52006Carbon nanotube interconnects in electrical and biological systemsNgo, Q.; De Asis, E.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
62007Carbon-based nanostructures as interconnects in electrical and biological systemsDe Asis, E.; Ngo, Q.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
72008Characterization of SOI Lamé-mode square resonatorsKhine, L.; Palaniapan, M. ; Shao, L.; Wong, W.-K. 
8Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
92001Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscopeThong, J.T.L. ; Wong, W.K. ; Zainal, A.
10Nov-2004Electron beam stimulated field-emission from single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Yieh, E.; Fabian Pease, R.; Dai, H.
11Nov-2004Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesWong, W.K. ; Rau, E.I.; Thong, J.T.L. 
1214-May-2006In situ observation of localized metallic nanocrystal growth on carbon nanotube templates in a scanning electron microscopeWong, W.-K. ; Lim, S.-H.; Thong, J.T.L. 
1320-Jul-2007In-plane motion characterization of MEMS resonators using stroboscopic scanning electron microscopyWong, C.-L.; Wong, W.-K. 
142008Multiwall carbon nanotube resonator for ultra-sensitive mass detectionWu, W. ; Palaniapan, M. ; Wong, W.-K. 
152007Non-destructive functionality and reliability assessment of dynamic MEMS using acoustic phonon characterizationWong, W.-K. ; Wong, C.-L.; Palaniapan, M. ; Tay, F.E.H. 
162006Non-invasive acoustic phonon characterization of dynamic MEMSWong, W.K. ; Palaniapan, M. ; Wong, C.L.; Wang, S.R.; Tay, F.E.H. 
172005Novel acoustic techniques for microelectronic failure analysis and characterizationWong, W.K. ; Street, A.G.
18Jul-2006Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubesWong, W.K. ; Nojeh, A.; Pease, R.F.W.
192006Phonon-mediated characterization of microelectromechanical resonatorsWong, W.-K. ; Palaniapan, M. 
202001Reduction of charging effects using vector scanning in the scanning electron microscopeThong, J.T.L. ; Lee, K.W.; Wong, W.K.