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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Refined By:
Author:  Lee, P.S.

Results 1-13 of 13 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Feb-2004Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometryMangelinck, D.; Lee, P.S.; Osipowitcz, T. ; Pey, K.L.
22000Characterization of Ni- and Ni(Pt)-silicide formation on narrow polycrystalline Si lines by Raman spectroscopyLee, P.S.; Mangelinck, D.; Pey, K.L. ; Ding, J. ; Osipowicz, T. ; Ho, C.S.; Chen, G.L.; Chan, L.
3Sep-2002Effect of ion implantation on layer inversion of Ni silicided poly-SiLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; Chan, L.
42007Effect of low fluence laser annealing on ultrathin Lu2 O3 high- k dielectricDarmawan, P.; Lee, P.S.; Setiawan, Y.; Ma, J.; Osipowicz, T. 
5Jan-2002Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stackLee, P.S.; Mangelinck, D.; Pey, K.L. ; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; See, A.
6Apr-2008Interface strain study of thin Lu2O3/Si using HRBSChan, T.K. ; Darmawan, P.; Ho, C.S.; Malar, P. ; Lee, P.S.; Osipowicz, T. 
72009Lanthanide-based graded barrier structure for enhanced nanocrystal memory propertiesChan, M.Y.; Chan, T.K. ; Osipowicz, T. ; Chan, L.; Lee, P.S.
8Mar-2002Layer inversion of Ni(Pt)Si on mixed phase Si filmsLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Osipowicz, T. ; See, A.
92008Lu2O3/Al2O gate dielectrics for germanium metal-oxide-semiconductor devicesDarmawan, P.; Chan, M.Y.; Zhang, T.; Setiawan, Y.; Seng, H.L.; Chan, T.K. ; Osipowicz, T. ; Lee, P.S.
10Mar-2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesLee, P.S.; Mangelinck, D.; Pey, K.L. ; Shen, Z.X. ; Ding, J. ; Osipowicz, T. ; See, A.
11Jul-2001Micro-RBS study of nickel silicide formationSeng, H.L. ; Osipowicz, T. ; Lee, P.S.; Mangelinck, D.; Sum, T.C. ; Watt, F. 
122005On the morphological changes of Ni- and Ni(Pt)-silicidesLee, P.S.; Pey, K.L.; Mangelinck, D.; Chi, D.Z.; Osipowicz, T. 
132002Thickness effect on nickel silicide formation and thermal stability for ultra shallow junction CMOSZhao, F.F.; Shen, Z.X. ; Zheng, J.Z.; Gao, W.Z.; Osipowicz, T. ; Pang, C.H.; Lee, P.S.; See, A.K.