Ong Keng Sian Vincent

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Full Name

Variants

Ong, V.K.S.
Ong, Vincent K.S.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

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Type: Article

Results 1-5 of 5 (Search time: 0.005 seconds).

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	Issue Date	Title	Author(s)
1	1994	A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan	Ong, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H.
2	May-1995	Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration	Chan, Daniel S.H. ; Ong, Vincent K.S. ; Phang, Jacob C.H.
3	Feb-1996	New developments in beam induced current methods for the failure analysis of VLSI circuits	Chan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F.
4	Jul-1997	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC	Osipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
5	1996	Unconnected junction contrast in ion beam induced charge microscopy	Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.