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|Title:||Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration||Authors:||Chan, Daniel S.H.
Ong, Vincent K.S.
Phang, Jacob C.H.
|Issue Date:||May-1995||Citation:||Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. (1995-05). Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration. IEEE Transactions on Electron Devices 42 (5) : 963-968. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381995||Abstract:||A direct method of extracting bulk minority carrier diffusion length and surface recombination velocity from an EBIC line scan in the planar configuration is described. The accuracy of the method is verified by 3-D computer simulation and compared with existing methods. It was found that this method is much simpler to use and gives better accuracy than existing methods.||Source Title:||IEEE Transactions on Electron Devices||URI:||http://scholarbank.nus.edu.sg/handle/10635/62049||ISSN:||00189383||DOI:||10.1109/16.381995|
|Appears in Collections:||Staff Publications|
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