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Frank Watt

rp04129

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Full Name
Frank Watt
(not current staff)
Variants
Watt, F.
Frank, W.
WATT, FRANK
FRANK WATT
 
Main Affiliation
 
Faculty
 
Email
phywattf@nus.edu.sg
 
Other emails
 

Publications

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Author:  Watt, F.
Type:  Conference Paper

Results 1-20 of 72 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
122-Jan-20032 MeV proton channeling contrast microscopy of LEO GaN thin film structuresOsipowicz, T. ; Teo, E.J. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2Jul-2001A LabVIEW™-based scanning and control system for proton beam micromachiningBettiol, A.A. ; Van Kan, J.A. ; Sum, T.C. ; Watt, F. 
3Apr-2005A progress review of proton beam writing applications in microphotonicsBettiol, A.A. ; Sum, T.C. ; Cheong, F.C. ; Sow, C.H. ; Venugopal Rao, S. ; Van Kan, J.A. ; Teo, E.J. ; Ansari, K. ; Watt, F. 
42002A study of the decomposition of GaN during annealing over a wide range of temperaturesRana, M.A.; Choi, H.W.; Breese, M.B.H. ; Osipowicz, T. ; Chua, S.J. ; Watt, F. 
51997Air pollution in Singapore: Its multielemental aspect as measured by nuclear analytical techniquesOrlić, I. ; Wenlan, B.; Watt, F. ; Tang, S.M. 
6Apr-2005An automatic beam focusing system for MeV protonsUdalagama, C.N.B. ; Bettiol, A.A. ; Van Kan, J.A. ; Teo, E.J. ; Breese, M.B.H. ; Osipowicz, T. ; Watt, F. 
72005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
82005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
9Jul-2001Channeling contrast microscopy on lateral epitaxial overgrown GaNTeo, E.J. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
1020-Mar-2002Characteristics of CVD diamond films in detecting UV, x-ray and alpha particleAhn, J.; Gan, B.; Zhang, Q.; Rusli; Yoon, S.F.; Ligatchev, V.; Wang, S.-G.; Huang, Q.-F.; Chew, K.; Patran, A.-C.; Serban, A.; Liu, M.-H.; Lee, S.; Bettiol, A.A. ; Osipowicz, T. ; Watt, F. 
111997Deep ion beam lithography for micromachining applicationsSpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Lee, S.; Watt, F. 
12Apr-2005Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. ; Watt, F. 
13Jan-2004Distribution and chemical state analysis of iron in the Parkinsonian substantia nigra using synchrotron radiation micro beamsIde-Ektessabi, A.; Kawakami, T.; Watt, F. 
142003Erbium doped waveguide amplifiers fabricated using focused proton beam irradiationLiu, K.; Pun, E.Y.B.; Sum, T.C. ; Bettiol, A.A. ; Van Kan, J.A. ; Watt, F. 
15Apr-2005Fabrication of a free standing resolution standard for focusing MeV ion beams to sub 30 nm dimensionsVan Kan, J.A. ; Shao, P.G. ; Molter, P.; Saumer, M.; Bettiol, A.A. ; Osipowicz, T. ; Watt, F. 
162008Fabrication of integrated channel waveguides in polydimethylsiloxane (PDMS) using proton beam writing (PBW): Applications for fluorescence detection in microfluidic channelsUdalagama, C.N.B. ; Chan, S.F.; Homhuan, S.; Bettiol, A.A. ; Wohland, T. ; Watt, F. 
17Sep-2003Fabrication of micro-optical components in polymer using proton beam micro-machining and modificationBettiol, A.A. ; Sum, T.C. ; Van Kan, J.A. ; Watt, F. 
182004Fabrication of micro-optical components in polymer using proton beam writingBettiol, A.A. ; Ansari, K. ; Sum, T.C. ; Van Kan, J.A. ; Watt, F. 
192-Feb-2006Fabrication of optical waveguides using proton beam writingBettiol, A.A. ; Venugopal Rao, S.; Sum, T.C. ; Van Kan, J.A. ; Watt, F. 
202004Fabrication of silicon microstructures using a high energy ion beamTeo, E.J. ; Liu, M.H. ; Breese, M.B.H. ; Tavernier, E.P.; Bettiol, A.A. ; Blackwood, D.J. ; Watt, F.