1. ScholarBank@NUS

Pey Kin Leong

rp03121

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Pey Kin Leong
Variants
PEY, KIN-LEONG
PEY, KIN L.
LEONG, KIN
Pey, Kin Leong
PEY, KIN LEONG
Pey, K.L.
 
Main Affiliation
 
Faculty
 

Publications

Results 61-70 of 70 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
611-Jun-2000Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy filmsChoi, W.K. ; Bera, L.K. ; Chen, J.H. ; Feng, W.; Pey, K.L. ; Yoong, H.; Mi, J.; Zhang, F.; Yang, C.Y.
622000Study of implanted boron distribution in p+n structures using scanning capacitance microscopyTeo, Y.L.; Pey, K.L. ; Chim, W.K. ; Chong, Y.F.
632001Study of the morphological modifications induced by laser annealing of preamorphized siliconChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; See, A.
4Sep-2004The interfacial reaction of Ni with (111)Ge, (100)Si0.75Ge 0.25 and (100)Si at 400 °CJin, L.J.; Pey, K.L. ; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.; Tung, C.H.
5May-2003The statistical distribution of percolation current for soft breakdown in ultrathin gate oxideLin, W.H.; Pey, K.L. ; Dong, Z.; Chooi, S.Y.M. ; Ang, C.H.; Zheng, J.Z.
6May-2003The statistical distribution of percolation current for soft breakdown in ultrathin gate oxideLin, W.H.; Pey, K.L. ; Dong, Z.; Chooi, S.Y.M. ; Ang, C.H.; Zheng, J.Z.
7Nov-2002Thermal reaction of nickel and Si0.75Ge0.25 alloyPey, K.L. ; Choi, W.K. ; Chattopadhyay, S.; Zhao, H.B.; Fitzgerald, E.A.; Antoniadis, D.A.; Lee, P.S.
81999Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formationHo, C.S.; Pey, K.L. ; Tung, C.H.; Tee, K.C.; Prasad, K.; Saigal, D.; Tan, J.J.L.; Wong, H.; Lee, K.H.; Osipowicz, T. ; Chua, S.J. ; Karunasiri, R.P.G. 
2925-Jul-2000Ultra-low sheet resistance metal/poly-si gate for deep sub-micron CMOS applicationLIM, CHONG WEE; PEY, KIN LEONG ; SIAH, SOH YUN; LIM, ENG HWA ; CHAN, LAP
10Nov-2001X-ray photoemission spectroscopy study of silicidation of Ti on BF2 +-implanted polysiliconChua, H.N.; Pey, K.L. ; Lai, W.H.; Chai, J.W.; Pan, J.S.; Chua, D.H.C.; Siah, S.Y.