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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]
Author:  Chim, W.K.

Results 21-36 of 36 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
2131-May-2004Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectricNg, T.H.; Chim, W.K. ; Choi, W.K. ; Ho, V.; Teo, L.W.; Du, A.Y.; Tung, C.H.
2Oct-2003Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy MeasurementsChim, W.K. ; Wong, K.M. ; Yeow, Y.T.; Hong, Y.D.; Lei, Y. ; Teo, L.W.; Choi, W.K. 
32006Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles studyZheng, J.X.; Ceder, G.; Maxisch, T.; Chim, W.K. ; Choi, W.K. 
418-Mar-2002Observation of memory effect in germanium nanocrystals embedded in an amorphous silicon oxide matrix of a metal-insulator-semiconductor structureChoi, W.K. ; Chim, W.K. ; Heng, C.L.; Teo, L.W.; Ho, V.; Ng, V. ; Antoniadis, D.A.; Fitzgerald, E.A.
515-Mar-2004Origin of charge trapping in germanium nanocrystal embedded SiO 2 system: Role of interfacial traps?Kan, E.W.H.; Choi, W.K. ; Chim, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.
6Jul-2004Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide charge storage layerTan, Y.-N.; Chim, W.-K. ; Cho, B.J. ; Choi, W.-K. 
72002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
81-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
9Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
1015-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
1115-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
124-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
13Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. 
142007Synthesis and electronic application of germanium nanocrystals in silicon oxide matrixChoi, W.K. ; Chim, W.K. ; Chew, H.G.
151-Aug-2004Synthesis of germanium nanodots on silicon using an anodic alumina membrane maskChen, Z.; Lei, Y.; Chew, H.G.; Teo, L.W.; Choi, W.K. ; Chim, W.K. 
162002Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanismsNg, T.H.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.