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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Department:  MATERIALS SCIENCE

Results 81-100 of 106 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
81May-2005Sputtered deposited nanocrystalline ZnO films: A correlation between electrical, optical and microstructural propertiesLee, J.; Gao, W.; Li, Z.; Hodgson, M.; Metson, J.; Gong, H. ; Pal, U.
8215-May-1999Structure and magnetization of MnSb thin films deposited at different substrate temperaturesLow, B.L.; Ong, C.K. ; Lin, J. ; Huan, A.C.H. ; Gong, H. ; Liew, T.Y.F. 
83Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
8423-May-2005Study on anomalous n -type conduction of P-doped ZnO using P2 O5 dopant sourceYu, Z.G.; Gong, H. ; Wu, P.
852005Study on p-type ZnO: A potential new source of solid state lightingYu, Z.G.; Wu, P.; Gong, H. 
861999Study on the effect of incorporating nitrogen ions on titanium disilicide thin film formation for ULSI applicationsLim, C.W.; Bourdillon, A.J. ; Gong, H. ; Lahiri, S.K.; Pey, K.L.; Lee, K.H.
8725-Nov-2002Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer depositionHo, M.-Y.; Gong, H. ; Wilk, G.D.; Busch, B.W.; Green, M.L.; Lin, W.H.; See, A.; Lahiri, S.K.; Loomans, M.E.; Räisänen, P.I.; Gustafsson, T.
882003Surface electronic structure of nitric-oxide-treated indium tin oxideJianqiao, H.; Jisheng, P.; Zhu, F.; Hao, G. 
891-Oct-2001Surface photovoltaic properties of sputtered Mo/Si multilayersLi, W. ; Gong, H. ; Cao, Y.; Du, H.
9019-Jul-1999Surface smoothing of floating gates in flash memory devices via surface nitrogen and carbon incorporationCha, C.-L.; Chor, E.-F. ; Gong, H. ; Bourdillon, A.J. ; Jia, Y.-M.; Pan, J.-S. ; Zhang, A.-Q.; Chan, L.
911995The charging behaviour and internal electric field of PMMA irradiated by a kiloelectronvolt electron beamChen, H.; Gong, H. ; Ong, C.K. 
926-Mar-1998The effect of Al3+, Na+ and Li+ impurities on the charging ability of single-crystalline quartz under electron beam irradiationSong, Z.G.; Gong, H. ; Ong, C.K. 
931-Aug-2005The influence of Cu/Al ratio on properties of chemical-vapor-deposition-grown p -type Cu-Al-O transparent semiconducting filmsCai, J. ; Gong, H. 
9430-Nov-1997The particle size of latexes from dispersion polymerization of styrene using poly(ethylene oxide) macromonomer as a polymerizable stabilizerLiu, J.; Gan, L.M. ; Chew, C.H. ; Quek, C.H. ; Gong, H. ; Gan, L.H.
952004The study of bonding composition of CNx film by thermal degradation methodZhang, L.H.; Gong, H. ; Li, Y.Q.; Wang, J.P.
967-Jun-1997The trapping and distribution of charge in polarized polymethylmethacrylate under electron-beam irradiationSong, Z.G.; Gong, H. ; Ong, C.K. 
972000The use of sample rotation in SIMS profiling of Ta barrier layers to Cu diffusionLiu, R. ; Wee, A.T.S. ; Liu, L. ; Hao, G. 
98Jan-2002Theoretical study of Cr diffusion in Co-Cr alloy thin film recording mediaJin, D.; Wang, J.P.; Gong, H. 
994-Mar-2002Thermal decomposition kinetics of amorphous carbon nitride and carbon filmsZhang, L.H.; Gong, H. ; Wang, J.P. 
1001998Threshold voltage instabilities of fresh flash memory devices caused by plasma chargingCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.