Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1398071
Title: Surface photovoltaic properties of sputtered Mo/Si multilayers
Authors: Li, W. 
Gong, H. 
Cao, Y.
Du, H.
Issue Date: 1-Oct-2001
Citation: Li, W., Gong, H., Cao, Y., Du, H. (2001-10-01). Surface photovoltaic properties of sputtered Mo/Si multilayers. Journal of Applied Physics 90 (7) : 3422-3426. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1398071
Abstract: Structural and photovoltaic properties of magnetron sputtered Mo/Si multilayers were studied. Low-angle x-ray diffraction patterns demonstrated that the films had sharp interfaces and good periodicity. Surface photovoltage spectroscopy (SPS) was employed to investigate the electronic transport properties of the multilayers. It was found that the photovoltaic response depended on the composition, the monolayer thickness, and the number of periods. The electronic confinement effects of the semiconductor layers were discussed with an energy band model. SPS results were related to the film structure of the multilayers determined through x-ray diffraction. © 2001 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/107222
ISSN: 00218979
DOI: 10.1063/1.1398071
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