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Ong Chong Kim

rp09728

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Full Name
Ong Chong Kim
(not current staff)
Variants
C.K. Ong
Ong, Chong Kim
Ong, C.-K.
Ong, C.K.
Ong, C.
ONG, CHONG KIM
 
Main Affiliation
 
Faculty
 
Email
phyongck@nus.edu.sg
 

Publications

Results 81-100 of 499 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
811993Defect processes in GaP: Implications for the behavior of excited surface defectsKhoo, G.S.; Ong, C.K. 
21994Dependence of charging on crystallographic orientations of an as-grown α-quartzGong, H. ; Taijing, L. ; Ong, C.K. 
31-Apr-2002Dependence of pulsed-laser deposition parameters on the microstructure and magnetic property of Nd-Fe-B thin films grown at high substrate temperatureHuang, X.J.; Xu, S.Y. ; Ong, C.K. ; Yang, Z.; Si, L. ; Li, Y. 
49-Jan-2003Design of one-dimensional microstrip bandstop filters with continuous patterns based on Fourier transformRao, X.S. ; Chen, L. ; Tan, C.Y. ; Lu, J.; Ong, C.K. 
5Nov-1998Designs of multi-target carousels for pulsed-laser deposition systemsXu, S.Y. ; Tan, C.W.; Ong, C.K. 
61995Determination of charge distribution volume in electron irradiated insulators by scanning electron microscopeChen, H.; Gong, H. ; Ong, C.K. 
7Jul-2004Determinations of upper critical fields in continuous Ginzburg-Landau modelWang, L.; Lim, H.S. ; Ong, C.K. 
81996Dielectric and electrical properties of ordinary Portland cement and slag cement in the early hydration periodZhang, X. ; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. ; Yang, J.
92009Dielectric dispersion of BaxSr1-xTiO3 thin film with parallel-plate and coplanar interdigital electrodesZhang, X.-Y. ; Song, Q.; Xu, F. ; Sheng, S.; Wang, P. ; Ong, C.K. 
102009Dielectric dispersion of BiFeO3 thin film over a broad frequency range (100 Hz-10 GHz)Zhang, X.-Y. ; Song, Q.; Xu, F. ; Ong, C.K. 
111993Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope techniqueOh, K.H. ; Le Gressus, C.; Gong, H. ; Ong, C.K. ; Tan, B.T.G. ; Ding, X.Z.
121993Diffusion and interconversion of 'defect' ad-dimers on the Si(001) 2*1 surface: A molecular statics studyToh, C.P.; Ong, C.K. 
131992Diffusion of a Si atom on the Si(001)-2×1 surface: A Monte Carlo studyToh, C.P.; Ong, C.K. 
141-May-2012Diluted antiferromagnet effect on magnetic and microwave characteristics of exchange-biased multilayered thin filmsPhuoc, N.N. ; Ong, C.K. 
151993Dimers and divacancy effects on a reconstructed Si(001) surfaceLim, H.S. ; Low, K.C.; Ong, C.K. 
1626-Jun-1998Direct morphology evidence of two-dimensional growth mode in pulsed-laser deposited YBa2Cu3O7-δ thin filmsXu, S.Y. ; Ong, C.K. ; Zhang, X. 
172009Direct observation of photonic jets and corresponding backscattering enhancement at microwave frequenciesZhao, L. ; Ong, C.K. 
1817-Feb-1997Discharging behaviour on insulator surfaces in vacuum: A scanning electron microscopy observationGong, H. ; Ong, C.K. 
191-Nov-1997Dissipation near Tc in a textured (Bi,Pb)2Sr2Ca2Cu3Oy, silver-clad tapeHan, G.C. ; Ong, C.K. 
20Dec-1989Dissociative adsorption of water on the Si (1 0 0) 2 × 1 reconstructed surfaceOng, C.K.