Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/42/6/065411
Title: Dielectric dispersion of BaxSr1-xTiO3 thin film with parallel-plate and coplanar interdigital electrodes
Authors: Zhang, X.-Y. 
Song, Q.
Xu, F. 
Sheng, S.
Wang, P. 
Ong, C.K. 
Issue Date: 2009
Citation: Zhang, X.-Y., Song, Q., Xu, F., Sheng, S., Wang, P., Ong, C.K. (2009). Dielectric dispersion of BaxSr1-xTiO3 thin film with parallel-plate and coplanar interdigital electrodes. Journal of Physics D: Applied Physics 42 (6) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/42/6/065411
Abstract: Ferroelectric BaxSr1-xTiO3 (BST) thin films with x = 0.25 and 0.5 were grown by pulsed laser deposition on single crystal LaAlO3 and Pt/Ti/SiO2/Si substrates, respectively. Capacitors were then fabricated from the BST thin films based on coplanar interdigital electrodes (CIEs) and parallel-plate electrodes (PPEs). The dielectric properties of the BST film with CIE and PPE were investigated and compared over a wide frequency range from 100 Hz to 10 GHz. The dielectric dispersion in PPE configuration, caused by the interfacial polarization in film/electrode interfaces, exhibited a strong dependence on frequency. However, the permittivity εCIE in CIE configuration shows a gentle variation with the frequency indicating interfacial polarization substantially suppressed. The influence upon the dielectric properties of the columnar BST grains due to the use of different forms of electrodes was discussed. © 2009 IOP Publishing Ltd.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/115066
ISSN: 00223727
DOI: 10.1088/0022-3727/42/6/065411
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