Please use this identifier to cite or link to this item:
https://doi.org/10.1103/PhysRevB.47.9346
Title: | Defect processes in GaP: Implications for the behavior of excited surface defects | Authors: | Khoo, G.S. Ong, C.K. |
Issue Date: | 1993 | Citation: | Khoo, G.S., Ong, C.K. (1993). Defect processes in GaP: Implications for the behavior of excited surface defects. Physical Review B 47 (15) : 9346-9349. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.47.9346 | Abstract: | We have investigated the different charge states and geometries of the P vacancy and Ga antisite defects in bulk GaP as well as on the GaP(110) surface. Similar behavior is observed for both the bulk and surface. The charged P vacancy VP+ exhibits symmetric outward relaxations from the vacancy site while VP0 and VP- display distortions that lower the symmetry. For the Ga antisite defect (GaP), the neutral GaP0 has a broken-bond configuration with one of its Ga nearest neighbors, while GaP- and GaP2- both have the centered configuration. However, due to their lack of symmetry, the atoms at the surface display a larger distortion. The effects of excitations initially lead to a more positive charge state of the surface defects and subsequently to bond weakening. © 1993 The American Physical Society. | Source Title: | Physical Review B | URI: | http://scholarbank.nus.edu.sg/handle/10635/96157 | ISSN: | 01631829 | DOI: | 10.1103/PhysRevB.47.9346 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.