1. ScholarBank@NUS

Phang, J.C.H.

rp08036

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Author:  Koh, L.S.

Results 1-20 of 21 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
22004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
32005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
42011Backside reflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
52011Characterization of MOS transistors using dynamic backside reflectance modulation techniqueTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
62004Correlation of flash memory defects detected with passive and active localization techniquesQuah, A.C.T.; Phang, J.C.H. ; Li, S.; Massoodi, M.; Yuan, C.; Koh, L.S.; Chan, K.H.; Chua, C.M.
72006DC-coupled laser induced detection system for fault localization in microelectronic failure analysisQuah, A.C.T.; Koh, L.S.; Chua, C.M.; Palaniappan, M.; Chin, J.M.; Phang, J.C.H. 
82009Design considerations for refractive solid immersion lens: Application to subsurface integrated circuit fault localization using laser induced techniquesGoh, S.H.; Sheppard, C.J.R. ; Quah, A.C.T.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
92006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
102007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
112007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
122008Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniquesGoh, S.H.; Quah, A.C.T.; Sheppard, C.J.R. ; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
132006Enhanced detection sensitivity with pulsed laser digital signal integration algorithmQuah, A.C.T.; Phang, J.C.H. ; Koh, L.S.; Tan, S.H.; Chua, C.M.
142009Laser timing probe with frequency mapping for locating signal maximaKoh, L.S.; Marks, H.; Ross, L.K.; Chua, C.M.; Phang, J.C.H. 
15Aug-2008Laser-induced detection sensitivity enhancement with laser pulsingQuah, A.C.T.; Chua, C.M.; Tan, S.H.; Koh, L.S.; Phang, J.C.H. ; Tan, T.L.; Gan, C.L.
1629-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
172008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
182007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
197-Jul-2011Negative backside thermoreflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
202001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.