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|Title:||Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques||Authors:||Goh, S.H.
|Issue Date:||2008||Citation:||Goh, S.H.,Quah, A.C.T.,Sheppard, C.J.R.,Chua, C.M.,Koh, L.S.,Phang, J.C.H. (2008). Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : -. ScholarBank@NUS Repository. https://doi.org/10.1109/IPFA.2008.4588146||Abstract:||The effect of Refractive Solid Immersion Lens (RSIL) parameters on the enhancement to laser induced fault localization techniques are investigated. The experimental results of the effect on a common laser induced technique, namely Thermally Induced Voltage Alteration (TIVA), and imaging are presented. A signal enhancement in the peak TIVA signal of close to 12 times has been achieved.||Source Title:||Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA||URI:||http://scholarbank.nus.edu.sg/handle/10635/70086||ISBN:||1424420393||DOI:||10.1109/IPFA.2008.4588146|
|Appears in Collections:||Staff Publications|
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