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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]

Results 21-40 of 83 (Search time: 0.011 seconds).

Issue DateTitleAuthor(s)
212008Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessorsQuah, A.C.T.; Goh, S.H.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
222010Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysisGoh, S.H.; Quah, A.C.T.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
23Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
24Nov-2012Complete modeling of subsurface microscopy system based on aplanatic solid immersion lensChen, R.; Agarwal, K. ; Zhong, Y.; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
252004Correlation of flash memory defects detected with passive and active localization techniquesQuah, A.C.T.; Phang, J.C.H. ; Li, S.; Massoodi, M.; Yuan, C.; Koh, L.S.; Chan, K.H.; Chua, C.M.
262000Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting deviceHeiderhoff, R.; Palaniappan, M. ; Phang, J.C.H. ; Balk, L.J.
272006DC-coupled laser induced detection system for fault localization in microelectronic failure analysisQuah, A.C.T.; Koh, L.S.; Chua, C.M.; Palaniappan, M.; Chin, J.M.; Phang, J.C.H. 
282005Dedicated near-field microscopies for electronic materials and devicesBalk, L.J.; Cramer, R.M.; Heiderhoff, R.; Phang, J.Ch. ; Sergeev, O.; Tiedemann, A.-K.
292009Design considerations for refractive solid immersion lens: Application to subsurface integrated circuit fault localization using laser induced techniquesGoh, S.H.; Sheppard, C.J.R. ; Quah, A.C.T.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
302006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
312007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
322010Determination of the local electric field strength by energy dispersive Photon Emission MicroscopyGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
332010Determination of the local electric field strength near electric breakdownGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
342010Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performanceJoshi, P.; Steen, S.; Sivakumar, K.; Yang, W.K.; Rossnagel, S.; Mittal, S.; Steiner, M.; Neumayer, D.; Kim, Y.H.; Nagalingam, D. ; Meng, L.; Bhatia, C.S. ; Phang, J.C.H. 
35Sep-2011Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced currentMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
3626-Sep-2011Dyadic Green's function for aplanatic solid immersion lens based sub-surface microscopyHu, L. ; Chen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
37May-2011Effect of polarization on a solid immersion lens of arbitrary thicknessLim, K.M.; Lee, G.C.F.; Sheppard, C.J.R. ; Phang, J.C.H. ; Wong, C.L.; Chen, X. 
382008Effect of refractive solid immersion lens parameters on the enhancement of laser induced fault localization techniquesSh, G.; Act, Q.; Cjr, S. ; Cm, C.; Ls, K.; Jch, P. 
392008Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniquesGoh, S.H.; Quah, A.C.T.; Sheppard, C.J.R. ; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
40Jan-2004Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope ImagesSim, K.S. ; Thong, J.T.L. ; Phang, J.C.H.