1. ScholarBank@NUS

Lau Wai Shing

rp07696

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Lau Wai Shing
Variants
Lau, W.S.
Lau, Wai Shing
 
Main Affiliation
 
Faculty
 

Publications

Refined By:
Type:  Conference Paper

Results 1-9 of 9 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11997Deep level states caused by dislocations in MBE grown p-InGaAs/GaAs heterostructuresDu, A.Y.; Li, M.F. ; Chong, T.C. ; Teo, K.L. ; Lau, W.S. 
21994Effects of low-temperature grown GaAs intermediate layers on the crystalline quality of GaAs-ON-Si epilayersChong, T.C. ; Phua, C.C.; Lau, W.S. ; Tan, L.S. 
31999Low-temperature grown GaAs and Al0.3Ga0.7As MISFETs - characterization and model developmentRao, Rapeta V.V.V.J. ; Chong, T.C. ; Tan, L.S. ; Lau, W.S. ; Liou, J.J.
41993New low-voltage contrast mechanism to image local defects in very thin silicon dioxide films. True oxide electron beam induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
51993New low-voltage contrast mechanism to image local defects in very thin silicon dioxide films. True oxide electron beam induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
61997New mechanism of leakage current in ultra-shallow junctions with TiSi2 contactsLau, Wai Shing ; Qian, Peng Wei; Zhao, Rong
71995New type of local defects in very thin silicon dioxide films on arsenic-implanted p-type siliconLau, W.S. ; Pey, K.S.; Ng, W.T.; Sane, V. ; Heng, J.M.C.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Cronquist, B.; Lee, Bob
81999Physical analytical model for LT-GaAs and LT-Al0.3Ga0.7 As MISFET DevicesRao, R.V.V.V.J. ; Chong, T.C. ; Tan, L.S. ; Lau, W.S. ; Liou, J.J.
91994Study of traps in semi-insulating III-V epitaxial films by zero bias transient current spectroscopyLau, W.S. ; Goo, C.H.; Chong, T.C. ; Tan, C.T.