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Huan Cheng Hon,Alfred

rp06875

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Profile

Full Name
Huan Cheng Hon,Alfred
(not current staff)
Variants
Huan, Cha
Huan, A.H.
Huan, C.H.A.
Huan, A.C.H.
Huan, C.H.
Huan, Alfred C.H.
Alfred, C.H.H.
Huan, C.-H.A.
Huan, A.
 
Main Affiliation
 
Faculty
 
Email
phyhuana@nus.edu.sg
 

Publications

Refined By:
Author:  Wee, A.T.S.
Department:  PHYSICS

Results 61-69 of 69 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
611999Synthesis and characterization of Ge nanocrystals immersed in amorphous SiOx matrixJie, Y.X. ; Wu, X. ; Huan, C.H.A. ; Wee, A.T.S. ; Guo, Y. ; Zhang, T.J.; Pan, J.S. ; Chai, J.; Chua, S.J. 
621993The interaction between CO and YBa2Cu3Ox as studied by TG/DTA, FTIR, and XPSLin, J. ; Neoh, K.G. ; Li, N. ; Tan, T.C. ; Wee, A.T.S. ; Huan, A.C.H. ; Tan, K.L. 
634-Jun-2001The structural and electronic properties of (AlN)x(C2)1-x and (AlN)x(BN)1-x alloysZheng, J.-C. ; Wang, H.-Q. ; Huan, C.H.A. ; Wee, A.T.S. 
6410-Sep-2001Trends in bonding configuration at SiC/III-V semiconductor interfacesZheng, J.-C. ; Wang, H.-Q. ; Wee, A.T.S. ; Huan, C.H.A. 
6524-Jan-2000Tungsten-carbon thin films deposited using screen grid technique in an electron cyclotron resonance chemical vapour deposition systemRusli; Yoon, S.F.; Yang, H.; Ahn, J.; Huang, Q.F.; Zhang, Q.; Guo, Y.P. ; Yang, C.Y. ; Teo, E.J. ; Wee, A.T.S. ; Huan, A.C.H. ; Watt, F. 
662000Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6fNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A. 
67Sep-2001Ultra shallow secondary ion mass spectrometry depth profiling: Limitation of sample rotation in improving depth resolutionNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.
6814-Dec-1996XPS studies on nitridation of InP(100) surface by N+ 2 ion beam bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
691999XPS study of incident angle effects on the ion beam modification of InP surfaces by 6 keV O2 +Pan, J.S. ; Tay, S.T.; Huan, C.H.A. ; Wee, A.T.S.