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Ong Keng Sian Vincent

rp05175

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Full Name
Ong Keng Sian Vincent
Variants
Ong, V.K.S.
Ong, Vincent K.S.
 
Main Affiliation
 
Faculty
 

Publications

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Department:  PHYSICS
Type:  Article

Results 1-3 of 3 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
1Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
2Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
31996Unconnected junction contrast in ion beam induced charge microscopyKolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.