Full Name
Hou Yong Tian
(not current staff)
Variants
Hou, Yong Tian
Hou, Y.T.
Hou, Y.-T.
Hou, Y.
 
 
 
Email
elehyt@nus.edu.sg
 
Other emails
 

Publications

Refined By:
Type:  Conference Paper
Department:  ELECTRICAL ENGINEERING

Results 1-9 of 9 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12003Germanium MOS: An Evaluation from Carrier Quantization and Tunneling CurrentLow, T.; Hou, Y.T. ; Li, M.F. ; Zhu, C. ; Kwong, D.-L.; Chin, A.
2Dec-2001Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substratesFeng, Z.C.; Yang, T.R.; Hou, Y.T. 
3Dec-2001Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substratesFeng, Z.C.; Yang, T.R.; Hou, Y.T. 
42003Investigation of Performance Limits of Germanium Double-Gated MOSFETsLow, T.; Hou, Y.T. ; Li, M.F. ; Zhu, C. ; Chin, A.; Samudra, G. ; Chan, L.; Kwong, D.-L.
51999Piezoelectric Franz-Keldysh effect in a GaN/InGaN/AlGaN multilayer structureHou, Yong Tian ; Teo, Kie Leong ; Li, Ming Fu ; Uchida, Kazuo; Tokunaga, Hiroki; Akutsu, Nakao; Matsumoto, Koh
61999Piezoelectric Franz-Keldysh effect in a GaN/InGaN/AlGaN multilayer structureHou, Yong Tian ; Teo, Kie Leong ; Li, Ming Fu ; Uchida, Kazuo; Tokunaga, Hiroki; Akutsu, Nakao; Matsumoto, Koh
72002Quantum tunneling and scalability of HfO2 and HfAlO gate stacksHou, Y.T. ; Li, M.F. ; Yu, H.Y. ; Jin, Y.; Kwong, D.-L.
81999Structural and optical properties of GaN materials grown on Si by metalorganic chemical vapor depositionChen, J.L.; Feng, Z.C. ; Zhang, X.; Chua, S.J. ; Hou, Y.T. ; Lin, J. 
92003Thermally Robust High Quality HfN/HfO 2 Gate Stack for Advanced CMOS DevicesYu, H.Y. ; Kang, J.F. ; Chen, J.D. ; Ren, C.; Hou, Y.T. ; Whang, S.J. ; Li, M.-F. ; Chan, D.S.H. ; Bera, K.L.; Tung, C.H.; Du, A.; Kwong, D.-L.