1. ScholarBank@NUS

Ee Beng, Arthur Tay

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Full Name
Ee Beng, Arthur Tay
Variants
Tay, Arthur
Tay, A.
Tay, E.B.
 
Main Affiliation
 
Faculty
 
Email
eletaya@nus.edu.sg
 

Publications

Results 101-112 of 112 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
10120-Oct-2004Searching oligo sets of human chromosome 12 using evolutionary strategiesJoe, Y.-Y.; Tay, A. ; Dong, Z.-Y.; Ng, H.-H. ; Xu, H.
102May-2006Simple tilt and height location monitoring of wafersNg, T.W. ; Tay, A. ; Ong, C.J.
1032015Singapore Tele-technology Aided Rehabilitation in Stroke (STARS) trial: Protocol of a randomized clinical trial on tele-rehabilitation for stroke patientsKoh G.C.-H. ; Yen S.C. ; Tay A. ; Cheong A.; Ng Y.S.; De Silva D.A.; Png C.; Caves K.; Koh K.; Kumar Y.; Phan S.W.; Tai B.C. ; Chen C.; Chew E.; Chao Z.; Chua C.E.; Koh Y.S.; Hoenig H.
1042001Spatially-programmable thermal processing module for 300 mm wafer processingTay, A. ; Khiang Wee Lim; Ai Poh Loh; Woei Wan Tan; Weng Khuen Ho; Huang, A. ; Fu, J. 
10515-Jan-2009Spot focus size effect in spectroscopic ellipsometry of thin filmsNg, T.W.; Tay, A. ; Wang, Y.
1062013Study of web guide slippage phenomena in roll-to-roll embossing systeTan, H.; Wenjing, M.; Binglu, D.; Loong, C.S.; Meng, K.C.; Tay, A. 
107Feb-2007Temperature control and in situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Zhou, Y.; Tan, W.W. ; Chen, M.
82004Temperature control and in-situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Lim, K.W.
9Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
102010Timing performance oriented Optical proximity correction for mask cost reductionQu, Y.; Teh, S.H.; Heng, C.H. ; Tay, A. ; Lee, T.H. 
11Nov-2005Using the OPC standard for real-time process monitoring and controlLiu, J.; Lim, K.W.; Ho, W.K. ; Tan, K.C. ; Tay, A. ; Srinivasan, R. 
122003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.