Full Name
Cho Byung-Jin
(not current staff)
Variants
Cho, Byung Jin
CHO, BYUNG JIN
Cho, B.
Cho, B.J.
Cho, B.C.
Cho, Byung-Jin
Byung, J.C.
Cho, B.-J.
 
 
 
Email
elebjcho@nus.edu.sg
 

Refined By:
Department:  COLLEGE OF DESIGN AND ENGINEERING
Author:  Cho, B.J.
Type:  Conference Paper
Date Issued:  2003

Results 1-10 of 10 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12003Fully Silicided NiSi and Germanided NiGe Dual Gates on SiO 2/Si and Al 2O 3/Ge-On-Insulator MOSFETsHuang, C.H.; Yu, D.S.; Chin, A.; Wu, C.H.; Chen, W.J.; Zhu, C. ; Li, M.F. ; Cho, B.J. ; Kwong, D.-L.
22003HfO2 and Lanthanide-doped HfO2 MIM Capacitors for RF/Mixed IC ApplicationsKim, S.J. ; Cho, B.J. ; Li, M.-F. ; Zhu, C. ; Chin, A. ; Kwong, D.-L. 
32003High Performance ALD HfO 2-Al 2O 3 Laminate MIM Capacitors for RF and Mixed Signal IC ApplicationsHu, H.; Ding, S.-J. ; Lim, H.F. ; Zhu, C. ; Li, M.F. ; Kim, S.J. ; Yu, X.F.; Chen, J.H. ; Yong, Y.F.; Cho, B.J. ; Chan, D.S.H. ; Rustagi, S.C.; Yu, M.B.; Tung, C.H.; Du, A.; My, D.; Foo, P.D.; Chin, A.; Kwong, D.-L.
42003Material and electrical characterization of HfO2 films for MIM capacitors applicationHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
52003MIM capacitors with HfO2 and HfAlOx for Si RF and analog applicationsYu, X.; Zhu, C. ; Hu, H.; Chin, A.; Li, M.F. ; Cho, B.J. ; Kwong, D.-L.; Foo, P.D.; Yu, M.B.
62003Photoluminescence from Silicon Nanocrystals Formed by Pulsed-Laser DepositionChen, X.Y.; Lu, Y.F.; Wu, Y.H. ; Cho, B.J. ; Song, W.D. ; Hu, H.
72003Silicon Nanostructured Films Formed by Pulsed-Laser Deposition in Inert Gas and Reactive GasChen, X.Y.; Lu, Y.F. ; Wu, Y.H. ; Cho, B.J. ; Hu, H.
82003The mechanisms of photoluminescence from Si nanocrystals formed by pulsed-laser depositionChen, X.Y.; Lu, Y.F.; Wu, Y.H. ; Cho, B.J. 
92003Very Low Defects and High Performance Ge-On-insulator p-MOSFETs with Al2O3 Gate DielectricsHuang, C.H.; Yang, M.Y.; Chin, A.; Chen, W.J.; Zhu, C.X. ; Cho, B.J. ; Li, M.-F. ; Kwong, D.L.
102003Voltage and Temperature Dependence of Capacitance of High-K HfO 2 MIM Capacitors: A Unified Understanding and PredictionZhu, C. ; Hu, H.; Yu, X.; Kim, S.J. ; Chin, A.; Li, M.F. ; Cho, B.J. ; Kwong, D.L.