Kim Sun-Jung

Collaboration Map View Statistics Email Alert RSS Feed

Full Name

Kim Sun-Jung

Variants

Kim, S.-J.
Kim, Sun Jung
Kim, S.J.
Kim, Sun-Jung

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

Results 21-26 of 26 (Search time: 0.011 seconds).

Refman EndNote Bibtex RefWorks Excel CSV PDF Send via email

	Issue Date	Title	Author(s)
21	1999	Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions	Cho, Byung Jin ; Kim, Sun Jung ; Ling, C.H. ; Joo, Moon Sig ; Yeo, In Seok
22	1999	Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions	Cho, Byung Jin ; Kim, Sun Jung ; Ling, C.H. ; Joo, Moon Sig ; Yeo, In Seok
23	2000	Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias	Ang, Chew-Hoe; Ling, Chung-Ho ; Cheng, Zhi-Yuan ; Kim, Sun-Jung ; Cho, Byung-Jin
24	Apr-2001	Reliability of thin gate oxides irradiated under X-ray lithography conditions	Cho, B.J. ; Kim, S.J. ; Ang, C.H.; Ling, C.H. ; Joo, M.S.; Yeo, I.S.
25	Jun-2004	RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applications	Ding, S.-J. ; Hu, H.; Zhu, C. ; Kim, S.J. ; Yu, X.; Li, M.-F. ; Cho, B.J. ; Chan, D.S.H. ; Yu, M.B.; Rustagi, S.C.; Chin, A.; Kwong, D.-L.
26	2003	Voltage and Temperature Dependence of Capacitance of High-K HfO 2 MIM Capacitors: A Unified Understanding and Prediction	Zhu, C. ; Hu, H.; Yu, X.; Kim, S.J. ; Chin, A.; Li, M.F. ; Cho, B.J. ; Kwong, D.L.