1. ScholarBank@NUS

Tao Jing Mei

rp02860

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Tao Jing Mei
Variants
TAO, JING MEI
Tao, J.M.
 
Main Affiliation
 
Faculty
 

Publications

Results 1-8 of 8 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
11997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
2Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
37-Sep-1997Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopyChim, W.K. ; Chan, D.S.H. ; Tao, J.M. ; Lou, C.L.; Leang, S.E.; Teow, C.K.
3241996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
3251999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
3263-Mar-1998Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingCHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU 
3271995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
814-May-1996Spectroscopic observations of photon emissions in n-MOSFETs in the saturation regionTao, J.M. ; Chan, D.S.H. ; Chim, W.K.