1. ScholarBank@NUS

Thye Shen, Andrew Wee

rp02822

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Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2023]
Date Issued:  [2000 TO 2009]

Results 61-80 of 337 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
6118-May-2006Effect of cobalt doping concentration on the structural and magnetic properties of Fe3O4Tripathy, D. ; Adeyeye, A.O. ; Piramanayagam, S.N.; Mah, C.S.; Gao, X. ; Wee, A.T.S. 
6225-Jan-2006Effect of functional group (fluorine) of aromatic thiols on electron transfer at the molecule-metal interfaceChen, W. ; Wang, L. ; Huang, C.; Lin, T.T.; Gao, X.Y. ; Loh, K.P. ; Chen, Z.K.; Wee, A.T.S. 
6327-Oct-2003Effect of germanium concentration and tunnel oxide thickness on nanocrystal formation and charge storage/retention characteristics of a trilayer memory structureHo, V.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Tay, M.S.; Antoniadis, D.A.; Fitzgerald, E.A.; Du, A.Y.; Tung, C.H.; Liu, R. ; Wee, A.T.S. 
642000Effect of ITO carrier concentration on the performance of organic light-emitting diodesZhu, F.; Zhang, K.; Huan, C.H.A. ; Wee, A.T.S. ; Guenther, E.; Jin, C.S.
6531-Jul-2007Effect of molecule-substrate interaction on thin-film structures and moleculer orientation of pentance on silver and goldZheng, Y. ; Qi, D. ; Chandrasekhar, N.; Gao, X. ; Troadec, C.; Wee, A.T.S. 
66Apr-2004Effect of parylene layer on the performance of OLEDKe, L.; Kumar, R.S.; Zhang, K.; Chua, S.-J.; Wee, A.T.S. 
6718-Mar-2008Effect of tip size on force measurement in atomic force microscopyLim, L.T.W.; Wee, A.T.S. ; O'Shea, S.J.
682001Effect of Y addition on the corrosion behavior of melt-spun amorphous Mg-Cu ribbonsYao, H.B.; Li, Y. ; Wee, A.T.S. ; Pan, J.S.; Chai, J.W.
692009Effects and thermal stability of hydrogen microwave plasma treatment on tetrahedral amorphous carbon films by in situ ultraviolet photoelectron spectroscopyChua, D.H.C. ; Hsieh, J.; Gao, X. ; Qi, D. ; Chen, S. ; Varghese, B. ; Sow, C.H. ; Wee, A.T.S. ; Lu, J.; Loh, K.P. ; Yu, X. ; Moser, H.O. 
702005Effects of CF4 plasma on the field emission properties of aligned multi-wall carbon nanotube filmsZhu, Y.W. ; Cheong, F.C. ; Yu, T. ; Xu, X.J. ; Lim, C.T. ; Thong, J.T.L. ; Shen, Z.X. ; Ong, C.K. ; Liu, Y.J. ; Wee, A.T.S. ; Sow, C.H. 
71Aug-2003Effects of first rapid thermal annealing temperature on Co silicide formationPeng, H.J.; Shen, Z.X. ; Lim, E.H.; Lai, C.W.; Liu, R. ; Wee, A.T.S. ; Sameer, A.; Dai, J.Y.; Zhang, B.C.; Zheng, J.Z.
722006Effects of O2 dissociation on a porous platinum coating in the thermal oxidation of GaAsHultquist, G.; Graham, M.J.; Wee, A.T.S. ; Liu, R. ; Sproule, G.I.; Dong, Q.; Anghel, C.
73May-2001Effects of oxygen flooding on crater bottom composition and roughness in ultrashallow secondary ion mass spectrometry depth profilingNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.
7411-Jul-2005Efficient field emission from α- Fe2 O3 nanoflakes on an atomic force microscope tipZhu, Y.W. ; Yu, T. ; Sow, C.H. ; Liu, Y.J. ; Wee, A.T.S. ; Xu, X.J. ; Lim, C.T. ; Thong, J.T.L. 
759-Jul-2001Electric field-induced carbon nanotube junction formationHo, G.W. ; Wee, A.T.S. ; Lin, J. 
769-Nov-2005Electrical discharge in a nanometer-sized air/water gap observed by atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Adamiak, K.; Wee, A.T.S. 
772006Electronic and optical properties of nitrogen-doped multiwalled carbon nanotubesLim, S.H.; Elim, H.I. ; Gao, X.Y. ; Wee, A.T.S. ; Ji, W. ; Lee, J.Y. ; Lin, J. 
7812-Jun-2009Electronic manifestation of cation-vacancy-induced magnetic moments in a transparent oxide semiconductor: Anatase Nb:TO2Zhang, S.; Ogale, S.B.; Yu, W.; Cao, X.; Liu, T.; Ghosh, S.; Das, G.P.; Wee, A.T.S. ; Greene, R.L.; Venkatesan, T. 
792006Electronic structure of Co-induced magic clusters grown on Si(111)-(7×7): Scanning tunneling microscopy and spectroscopy and real-space multiple-scattering calculationsZilani, M.A.K. ; Xu, H. ; Liu, T. ; Sun, Y.Y. ; Feng, Y.P. ; Wang, X.-S. ; Wee, A.T.S. 
801-Nov-2001Elimination of O2 plasma damage of low-k methyl silsesquioxane film by As implantationWang, C.Y.; Zheng, J.Z.; Shen, Z.X. ; Lin, Y.; Wee, A.T.S.