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|Title:||Electric field-induced carbon nanotube junction formation||Authors:||Ho, G.W.
|Issue Date:||9-Jul-2001||Citation:||Ho, G.W., Wee, A.T.S., Lin, J. (2001-07-09). Electric field-induced carbon nanotube junction formation. Applied Physics Letters 79 (2) : 260-262. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1383279||Abstract:||We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. © 2001 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/96392||ISSN:||00036951||DOI:||10.1063/1.1383279|
|Appears in Collections:||Staff Publications|
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