Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1383279
Title: Electric field-induced carbon nanotube junction formation
Authors: Ho, G.W. 
Wee, A.T.S. 
Lin, J. 
Issue Date: 9-Jul-2001
Citation: Ho, G.W., Wee, A.T.S., Lin, J. (2001-07-09). Electric field-induced carbon nanotube junction formation. Applied Physics Letters 79 (2) : 260-262. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1383279
Abstract: We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. © 2001 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/96392
ISSN: 00036951
DOI: 10.1063/1.1383279
Appears in Collections:Staff Publications

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