Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Refined By:
Date Issued:  [2000 TO 2023]
Date Issued:  [2000 TO 2009]
Date Issued:  2002
Author:  Liu, R.

Results 1-11 of 11 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
13-Jun-2002Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopyFan, W.J.; Yoon, S.F.; Ng, T.K.; Wang, S.Z.; Loke, W.K.; Liu, R. ; Wee, A. 
220-Jan-2002Crystalline phase separation of InGaN layer materials prepared by metalorganic chemical vapor depositionFeng, Z.C.; Yang, T.R.; Liu, R. ; Wee, A.T.S. 
314-Feb-2002Growth mechanisms in thin film epitaxy of Si/SiGe from hydridesZhang, J.; Woods, N.J.; Breton, G.; Price, R.W.; Hartell, A.D.; Lau, G.S.; Liu, R. ; Wee, A.T.S. ; Tok, E.S. 
4Jun-2002Infrared reflection investigation of ion-implanted and post-implantation-annealed epitaxially grown 6H-SiCChang, W.; Feng, Z.C. ; Lin, J. ; Liu, R. ; Wee, A.T.S. ; Tone, K.; Zhao, J.H.
52002Investigation of metal-organic chemical vapor deposited copper diffusion in tantalum after annealingLoh, S.W.; Zhang, D.H.; Liu, R. ; Li, C.Y.; Wee, A.T.S. 
6Feb-2002Phase separation in Zn-doped InGaN grown by metalorganic chemical vapor depositionFeng, Z.C.; Yang, T.R.; Liu, R. ; Wee, T.S.A. 
7May-2002SIMS backside depth profiling of ultrashallow implants using silicon-on-insulator substratesYeo, K.L.; Wee, A.T.S. ; Liu, R. ; Ng, C.M.; See, A.
820-Jan-2002Sims depth profiling analysis of Cu/Ta/SiO2 interfacial diffusion at different annealing temperatureLiu, L. ; Gong, H. ; Wang, Y. ; Wee, A.T.S. ; Liu, R. 
920-Jan-2002Study of copper diffusion into tantalum and tantalum diffusion into copperLoh, S.W.; Zhang, D.H.; Li, C.Y.; Liu, R. ; Wee, A.T.S. 
102002Study of copper diffusion into tantalum nitride (Ta2N) by rapid thermal annealing (RTA)Loh, S.W.; Zhang, D.H.; Liu, R. ; Li, C.Y.; Wee, A.T.S. 
11Jan-2002Substrate temperature studies of SrBi2(Ta1-xNbx)2O9 grown by pulsed laser ablation depositionTay, S.T.; Huan, C.H.A. ; Wee, A.T.S. ; Liu, R. ; Goh, W.C. ; Ong, C.K. ; Chen, G.S.