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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]

Results 81-100 of 125 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
812000Plasma etching optimization of oxide/nitride/oxide interpoly dielectric breakdown time in flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.
822006Properties of p-type and n-type ZnO influenced by P concentrationHu, G. ; Gong, H. ; Chor, E.F. ; Wu, P.
832006Properties of p-type and n-type ZnO influenced by P concentrationHu, G. ; Gong, H. ; Chor, E.F. ; Wu, P.
842009Properties of ZnO influenced by P concentrationHu, G. ; Gong, H. ; Wang, Y.; Liu, H.F.
852009Properties of ZnO influenced by P concentrationHu, G. ; Gong, H. ; Wang, Y.; Liu, H.F.
862007Radio-frequency magnetron sputtering and wet thermal oxidation of ZnO thin filmLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. ; Xiang, N. 
872007Radio-frequency magnetron sputtering and wet thermal oxidation of ZnO thin filmLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. ; Xiang, N. 
88Nov-2004Reactions of ultrathin hard amorphous carbon (a-C) films under microbeam laser processingZhang, L.H.; Gong, H. ; Li, Y.Q.; Wang, J.P.
892009Room temperature ferromagnetism of ZnO nanocrystals in amorphous ZnO- Al2 O3 matrixMa, Y.W.; Ding, J. ; Qi, D.C. ; Yi, J.B. ; Fan, H.M. ; Gong, H. ; Wee, A.T.S. ; Rusydi, A. 
9020-Jan-2002Sims depth profiling analysis of Cu/Ta/SiO2 interfacial diffusion at different annealing temperatureLiu, L. ; Gong, H. ; Wang, Y. ; Wee, A.T.S. ; Liu, R. 
912001SiO2 modified Co-ferrite with high coercivityDing, J. ; Gong, H. ; Melaka, R.; Wang, S. ; Shi, Y. ; Chen, Y.J. ; Phuc, N.X.
92May-2005Sputtered deposited nanocrystalline ZnO films: A correlation between electrical, optical and microstructural propertiesLee, J.; Gao, W.; Li, Z.; Hodgson, M.; Metson, J.; Gong, H. ; Pal, U.
932009Storage performance of LiFePO4 nanoplatesSaravanan, K. ; Reddy, M.V. ; Balaya, P. ; Gong, H. ; Chowdari, B.V.R. ; Vittal, J.J. 
942009Structure and optical properties of ZnO/NiSi/SiWei, R.; Gong, H. ; Dongzhi, C.
952008Structure and optical properties of ZnO/NiSi/Si systemWei, R.; Gong, H. ; Dongzhi, C.
962007Studies of galvanic corrosion (Al-Ti Cell) on microchip Al bondpads and elimination solutionsYounan, H.; Zhiqiang, M.; Siping, Z.; Hao, G. 
97Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
9823-May-2005Study on anomalous n -type conduction of P-doped ZnO using P2 O5 dopant sourceYu, Z.G.; Gong, H. ; Wu, P.
992005Study on p-type ZnO: A potential new source of solid state lightingYu, Z.G.; Wu, P.; Gong, H. 
10025-Nov-2002Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer depositionHo, M.-Y.; Gong, H. ; Wilk, G.D.; Busch, B.W.; Green, M.L.; Lin, W.H.; See, A.; Lahiri, S.K.; Loomans, M.E.; Räisänen, P.I.; Gustafsson, T.