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Weng Khuen Ho

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Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
Main Affiliation
 
Faculty
 
Email
elehowk@nus.edu.sg
 

Publications

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Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 41-60 of 126 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
41Jan-1991Generalised minimum-variance stochastic self-tuning controller with pole restrictionHang, C.C. ; Lim, K.W. ; Ho, W.K. 
421998Generalised predictive controller with pole restrictionLi, K.W.; Ho, M. ; Lee, T.H. ; Lin, K.V.; Xu, W.
431998Generalised predictive controller with pole restrictionLi, K.W.; Ho, M. ; Lee, T.H. ; Lin, K.V.; Xu, W.
44Sep-1999Getting more phase margin and performance out of PID controllersHo, W.K. ; Lim, K.W. ; Hang, C.C. ; Ni, L.Y.
45Sep-1999Getting more phase margin and performance out of PID controllersHo, W.K. ; Lim, K.W. ; Hang, C.C. ; Ni, L.Y.
46Feb-2010Guest Editorial: Special section on industrial controlHo, W.K. ; Qin, S.J.
47May-2011Guest Editorial: Special section on industrial controlVilanova, R.; Ho, W.K. 
48Jul-1993Implementation of a knowledge-based PID auto-tunerLee, T.H. ; Hang, C.C. ; Ho, W.K. ; Yue, P.K. 
491993Implementation of a knowledge-based PID auto-tunerLee, T.H. ; Hang, C.C. ; Ho, W.K. ; Yue, P.K. 
50Aug-2004In situ fault detection of wafer warpage in microlithographyHo, W.K. ; Tay, A. ; Zhou, Y.; Yang, K.
51Dec-2009In situ monitoring of photoresist thickness uniformity of a rotating wafer in lithographyTay, A. ; Ho, W.K. ; Wu, X.; Chen, X.
522005In-situ fault detection of wafer warpage in lithographyTay, A. ; Ho, W.K. ; Yap, C. ; Wei, C.; Tsai, K.-Y.
532005In-situ measurement & control of photoresist development in microlithographyKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Zhou, Y.
542004In-situ measurement and control for photoresist processing in microlithographyTay, A. ; Ho, W.-K. ; Wu, X.; Kiew, C.-M.
552007In-situ monitoring of photoresist thickness contourHo, W.K. ; Wu, X.; Tay, A. ; Chen, X.
5620-Mar-2013Influence function analysis of parameter estimation with generalized t distribution noise modelHo, W.K. ; Vu, H.D.; Ling, K.V.
57May-2011Integral-square-error performance of multiplexed model predictive controlLing, K.V.; Ho, W.K. ; Feng, Y.; Wu, B.
58May-2004Integrated bake/chill module with in situ temperature measurement for photoresist processingTay, A. ; Ho, W.-K. ; Loh, A.-P. ; Lim, K.-W. ; Tan, W.-W. ; Schaper, C.D.
592005Integrated metrology and processes for semiconductor manufacturingHo, W.K. ; Tay, A. ; Lim, K.W.; Loh, A.P. ; Tan, W.W. 
60Nov-2004Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K.