Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
 
 
Email
elehowk@nus.edu.sg
 

Publications

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Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 101-119 of 119 (Search time: 0.008 seconds).

Issue DateTitleAuthor(s)
1011998Robustness monitoring for PID control systemsHo, W.K. ; Wong, H.S.; Han, H.P.; Ni, L.Y.
1021998Robustness monitoring for PID control systemsHo, W.K. ; Wong, H.S.; Han, H.P.; Ni, L.Y.
103Feb-2008RTD response time estimation in the presence of temperature variations and its application to semiconductor manufacturingTan, W.W. ; Li, R.F.Y.; Loh, A.P. ; Ho, W.K. 
1042002Run-to-run process control for chemical mechanical polishing in semiconductor manufacturingDa, L.; Kumar, V.G.; Tay, A. ; Al Mamun, A. ; Ho, W.K. ; See, A.; Chan, L.
105May-2001Self-tuning IMC-PID control with interval gain and phase margins assignmentHo, W.K. ; Lee, T.H. ; Han, H.P.; Hong, Y.
1061997Self-tuning PID control of a plant with under-damped response with specifications on gain and phase marginsHo, W.K. ; Hang, C.C. ; Zhou, J.
107Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
108Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
1091998Structured fault-detection and diagnosis using finite-state automatonRamkumar, K.B.; Philips, Patrick; Presig, Heinz A.; Ho, W.K. ; Lim, K.W. 
110Feb-2007Temperature control and in situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Zhou, Y.; Tan, W.W. ; Chen, M.
1112004Temperature control and in-situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Lim, K.W.
112Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
113Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
1141992Towards intelligent PID controlÅström, K.J.; Hang, C.C. ; Persson, P.; Ho, W.K. 
1151997Tuning of multiloop proportional-integral-derivative controllers based on gain and phase margin specificationsHo, W.K. ; Lee, T.H. ; Gan, O.P.
1161997Tuning of multiloop proportional-integral-derivative controllers based on gain and phase margin specificationsHo, W.K. ; Lee, T.H. ; Gan, O.P.
1171995Tuning of PID controllers based on gain and phase margin specificationsHo, W.K. ; Hang, C.C. ; Cao, L.S.
118Nov-2005Using the OPC standard for real-time process monitoring and controlLiu, J.; Lim, K.W.; Ho, W.K. ; Tan, K.C. ; Tay, A. ; Srinivasan, R. 
1192003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.