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Voon Yew Thean

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Publications

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Department:  DEAN'S OFFICE (COLLEGE OF DESIGN & ENG)
Author:  Aaron Voon-Yew Thean
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Author:  Jieming Pan

Results 1-9 of 9 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
16-May-2022Engineered Nucleotide Chemicapacitive Microsensor Array Augmented with Physics-Guided Machine Learning for High-Throughput Screening of CannabidiolYap, Stephanie Hui Kit ; Pan, Jieming ; Dao, Viet Linh ; Zhang, Xiangyu ; Wang, Xinghua ; Teo, Wei Zhe ; Zamburg, Evgeny ; Tham, Chen-Khong ; Yew, Wen Shan ; Poh, Chueh Loo ; Thean, Aaron Voon-Yew 
211-Oct-2022First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation Effect for BEOL-Compatible Non-Volatile Logic SwitchChun-Kuei Chen; Zihang Fang; Sonu Hooda; Manohar Lal ; Umesh Chand ; Zefeng Xu; Jieming Pan ; Shih-Hao Tsai; Evgeny Zamburg ; Aaron Voon-Yew Thean 
32-Nov-2021Hybrid-Flexible Bimodal Sensing Wearable Glove System for Complex Hand Gesture RecognitionJieming Pan ; Yida Li ; Yuxuan Luo ; Xiangyu Zhang ; Xinghua Wang ; David Liang Tai Wong ; Chun-Huat Heng ; Chen-Khong Tham ; Aaron Voon-Yew Thean 
412-Aug-2022Non-destructive online seal integrity inspection utilizing autoencoder-based electrical capacitance tomography for product packaging assuranceJIEMING PAN ; Zaifeng Yang; THEAN VOON YEW, AARON ; STEPHANIE HUI KIT YAP ; ZHANG XIANGYU ; Li Yida ; LUO YUXUAN ; Evgeny Zamburg ; Tham Chen Khong ; En-Xiao Liu; Zefeng Xu
514-Sep-2022Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and ScalabilitySIVAN MAHESWARI ; LEONG JIN FENG ; JOYDEEP GHOSH ; TANG BAOSHAN ; JIEMING PAN ; Evgeny Zamburg ; THEAN VOON YEW, AARON 
66-Sep-2022Reconfigurable nonlinear photonic activation function for photonic neural network based on non-volatile opto-resistive RAM switchZefeng Xu; Baoshan Tang ; ZHANG XIANGYU ; LEONG JIN FENG ; Jieming Pan ; Sonu Hooda; Evgeny Zamburg ; Voon Yew Thean 
725-Oct-2020Seal Integrity Testing Utilizing Non-Destructive Capacitive Sensing for Product Packaging AssuranceJIEMING PAN ; Li Yida ; LUO YUXUAN ; ZHANG XIANGYU ; Zaifeng Yang; Wong Liang Tai,David ; Niu Xuhua ; Tham Chen Khong ; THEAN VOON YEW, AARON 
821-Apr-2022Significance of activation functions in developing an online classifier for semiconductor defect detectionMd Meftahul Ferdaus; Bangjian Zhou; Ji Wei Yoon; Kain Lu Low ; Jieming Pan ; Joydeep Ghosh ; Min Wu; Xiaoli Li; Aaron Voon-Yew Thean ; J. Senthilnath
928-Jun-2021Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistorsJIEMING PAN ; LOW KAIN LU ; JOYDEEP GHOSH ; Senthilnath Jayavelu; Md Meftahul Ferdaus; Shang Yi Lim; Evgeny Zamburg ; Li Yida ; TANG BAOSHAN ; WANG XINGHUA ; LEONG JIN FENG ; Savitha Ramasamy; Tonio Buonassisi; Tham Chen Khong ; THEAN VOON YEW, AARON