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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Author:  Chan, D.S.H.

Results 1-20 of 20 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
12007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
22004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
32005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
42000Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure AnalysisPalaniappan, M. ; Chin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
51-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
6Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
72006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
82007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
92007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
10Oct-2004Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror opticsChan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V.
112008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
122007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
1329-Apr-2003Pulsed single contact optical beam induced current analysis of integrated circuitsMIN, CHIN JIANN; KOLACHINA, SIVARAMAKRISHNA; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
1428-Jun-2005Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
1517-Aug-2004Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
16Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
17Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
18Aug-2001Single contact optical beam induced currentsChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M.; Gilfeather, G.; Soh, C.E.
192000Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis techniqueChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
202000Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis techniqueChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.