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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]

Results 61-80 of 83 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
612012Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Rao, S.S.P.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H. 
622009Optical near-field probe with embedded gallium scattering centerIsakov, D.V.; Zhang, Y.; Balk, L.J.; Phang, J.C.H. 
6329-Apr-2003Pulsed single contact optical beam induced current analysis of integrated circuitsMIN, CHIN JIANN; KOLACHINA, SIVARAMAKRISHNA; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
642009Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplificationHo, H.W.; Zheng, X.H.; Phang, J.C.H. ; Balk, L.J.
652009Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysisPhang, J.C.H. ; Gohl, S.H.; Quah, A.C.T.; Chua, M.; Koh, L.S.; Tan, S.H.; Chua, W.P.
66Jun-2012Resolution of aplanatic solid immersion lens based microscopyChen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
6728-Jun-2005Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
6817-Aug-2004Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
692000Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & MicrocharacterisationWong, W.K.; Yin, Q.R.; Thong, J.T.L. ; Phang, J.C.H. ; Fang, J.W.
702000Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & MicrocharacterisationWong, W.K.; Yin, Q.R.; Thong, J.T.L. ; Phang, J.C.H. ; Fang, J.W.
712008Scanning near-field photon emission microscopyIsakov, D.; Geinzer, T.; Tio, A.; Phang, J.C.H. ; Zhang, Y.; Balk, L.J.
722010SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cellsMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
7319-Aug-2003Selective deposition of a particle beam based on charging characteristics of a sampleKIN, WONG WAI ; PHANG, JACOB C. H. ; THONG, JOHN 
14Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
15Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
162013Single contact electron beam induced current technique for solar cell characterizationMeng, L.; Street, A.G.; Phang, J.C.H. ; Bhatia, C.S. 
17Aug-2001Single contact optical beam induced currentsChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M.; Gilfeather, G.; Soh, C.E.
182000Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis techniqueChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
192000Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis techniqueChin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
202001Single-image signal-to-noise ratio estimationThong, J.T.L. ; Sim, K.S. ; Phang, J.C.H.