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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Author:  Heiderhoff, R.

Results 1-11 of 11 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
12009Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion MicroscopyTiedemann, A.-K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
22005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
3Jun-2007Characterization of electronic materials and devices by scanning near-field microscopyBalk, L.J.; Heiderhoff, R.; Phang, J.C.H. ; Thomas, Ch.
42001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
52000Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting deviceHeiderhoff, R.; Palaniappan, M. ; Phang, J.C.H. ; Balk, L.J.
62005Dedicated near-field microscopies for electronic materials and devicesBalk, L.J.; Cramer, R.M.; Heiderhoff, R.; Phang, J.Ch. ; Sergeev, O.; Tiedemann, A.-K.
72010Determination of the local electric field strength by energy dispersive Photon Emission MicroscopyGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
82010Determination of the local electric field strength near electric breakdownGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
92009Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-systemTiedemann, A.-K.; Heiderhoff, R.; Balk, L.J.; Phang, J.C.H. 
10Sep-2009Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigationsTiedemann, A.-K.; Kurz, K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
112005Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopyHendarto, E.; Altes, A.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.