Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
 
 
Email
elecshd@nus.edu.sg
 

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Department:  COLLEGE OF DESIGN AND ENGINEERING
Department:  OFFICE OF THE PRESIDENT

Results 1-20 of 22 (Search time: 0.012 seconds).

Issue DateTitleAuthor(s)
11-Oct-1997A cleaning model for removal of particles due to laser-induced thermal expansion of substrate surfaceLu, Y.-F. ; Song, W.-D. ; Ye, K.-D. ; Lee, Y.-P.; Chan, D.S.H. ; Low, T.-S. 
21997A theoretical model for laser removal of particles from solid surfacesLu, Y.F. ; Song, W.D. ; Ang, B.W.; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
3Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
41998Automatic control and real-time monitoring of laser cleaning and laser ablationLu, Y.F. ; Meng, M.; Hong, M.H. ; Low, T.S. ; Chan, D.S.H. 
5Jan-1999Carbon nitride thin films deposited by nitrogen-ion-assisted KRF excimer ablation of graphiteFeng, L.Y. ; Min, R.Z.; Qiao, N.H.; Feng, H.Z.; Chan, D.S.H. ; Seng, L.T. ; Yin, C.S.; Gamani, K. ; Geng, C. ; Kun, L.
61-Jan-1988ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.Chim, W.K. ; Low, T.S. ; Chan, D.S.H. ; Phang, J.C.H. 
7Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
81996Excimer laser applications in integrated circuit packagingLu, Y.F. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
91997Laser cleaning of microparticles - Theoretical prediction of threshold laser fluenceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
101997Laser cleaning of microparticles - Theoretical prediction of threshold laser fluenceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
11Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
12Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
135-Oct-1999Pulse laser induced removal of mold flash on integrated circuit packagesLU, YONG FENG ; CHAN, DANIEL SIU HUNG ; LOW, TECK SENG 
14Dec-1997Removal of submicron particles from nickel-phosphorus surfaces by pulsed laser irradiationLu, Y.F. ; Song, W.D. ; Ye, K.D. ; Hong, M.H. ; Liu, D.M.; Chan, D.S.H. ; Low, T.S. 
151998Spectroscopic study of pulsed laser induced plasma from aluminum surfaceLu, Y.F. ; Tao, Z.B.; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
161998Steam laser cleaning of plasma-etch-induced polymers from via holesLee, Y.P.; Lu, Y.F. ; Chan, D.S.H. ; Low, T.S. ; Zhou, M.S.
171998Studies of carbon nitride thin films synthesized by KrF excimer ablation of graphite in nitrogen atmosphereRen, Z.M.; Lu, Y.F. ; Song, W.D. ; Chan, D.S.H. ; Low, T.S. ; Gamani, K. ; Chen, G. ; Li, K.
181-Sep-1998Studies of carbon nitride thin films synthesized by KrF excimer laser ablation of graphite in a nitrogen atmosphereLu, Y.F. ; Ren, Z.M.; Song, W.D. ; Chan, D.S.H. ; Low, T.S. ; Gamani, K. ; Chen, G. ; Li, K.
191998Theoretical modeling for laser cleaning of micro-particles from solid surfaceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
201998Theoretical modeling for laser cleaning of micro-particles from solid surfaceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S.