Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Refined By:
Author:  Chi, D.Z.

Results 1-10 of 10 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Sep-2002Effect of ion implantation on layer inversion of Ni silicided poly-SiLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; Chan, L.
21-Aug-2005Effect of Pt on agglomeration and Ge out diffusion in Ni(Pt) germanosilicideJin, L.J.; Pey, K.L.; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.; Rahman, Md.A.; Osipowicz, T. ; Tung, C.H.
3Aug-2005Effects of prolonged annealing on NiSi at low temperature (500°C)Anisur, M.R.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
4Jan-2002Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stackLee, P.S.; Mangelinck, D.; Pey, K.L. ; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; See, A.
51-Nov-2010Formation of epitaxial metastable NiGe2 thin film on Ge(100) by pulsed excimer laser annealLim, P.S.Y.; Chi, D.Z.; Lim, P.C.; Wang, X.C.; Chan, T.K. ; Osipowicz, T. ; Yeo, Y.-C. 
610-May-2006Growth of high quality Er-Ge films on Ge(001) substrates by suppressing oxygen contamination during germanidation annealingLiew, S.L.; Balakrisnan, B.; Chow, S.Y.; Lai, M.Y.; Wang, W.D.; Lee, K.Y.; Ho, C.S.; Osipowicz, T. ; Chi, D.Z.
72005Observation of a new kinetics to form Ni3Si2 and Ni31Si12 suicides at low temperature (200°C)Rahman, Md..A.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
82005On the morphological changes of Ni- and Ni(Pt)-silicidesLee, P.S.; Pey, K.L.; Mangelinck, D.; Chi, D.Z.; Osipowicz, T. 
92007Phase and texture of Er-germanide formed on Ge(001) through a solid-state reactionLiew, S.L.; Balakrisnan, B.; Ho, C.S.; Thomas, O. ; Chi, D.Z.
1031-Oct-2005Suppression of oxidation in nickel germanosilicides by Pt incorporationRahman, M.A.; Osipowicz, T. ; Pey, K.L.; Jin, L.J.; Choi, W.K.; Chi, D.Z.; Antoniadis, D.A.; Fitzgerald, E.A.; Isaacson, D.M.