Full Name
Moser,Herbert Oskar
(not current staff)
Variants
Moser, Herbert Oskar
MOSER, HERBERT O.
Moser, Herbert O
Moser, H.
Moser, H.O.
MOSER, HERBERT OSKAR
 
 
 
Email
slshom@nus.edu.sg
 

Publications

Results 21-40 of 68 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
211-Apr-2006Industrial applications of micro/nanofabrication at Singapore Synchrotron Light SourceJian, L.K. ; Casse, B.D.F. ; Heussler, S.P. ; Kong, J.R. ; Saw, B.T. ; Bin Mahmood, S. ; Moser, H.O. 
22Aug-2005Influence of plasma treatment on low-k dielectric films in semiconductor manufacturingYang, P. ; Lu, D. ; Kumar, R. ; Moser, H.O. 
232007Infrared spectro/microscopy at SSLS - Edge effect source in a compact superconducting storage ringBahou, M. ; Wen, L. ; Ding, X. ; Casse, B.D.F. ; Heussler, S.P. ; Gu, P. ; Diao, C. ; Moser, H.O. ; Sim, W.-S. ; Gu, J. ; Mathis, Y.-L.
41-Sep-2002Magnetic field of superconductive in-vacuo undulators in comparison with permanent magnet undulatorsMoser, H.O. ; Rossmanith, R.
5Dec-2006Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light sourceMoser, H.O. ; Bahou, M. ; Casse, B.D.F. ; Jian, L.K. ; Yang, P. ; Gao, X. ; Wee, A.T.S. 
62009Micro/nanomanufactured THz electromagnetic metamaterials as a base for applications in transportationMoser, H.O. ; Chen, H.S.; Jian, L.K. ; Bahoua, M. ; Kalaiselvi, S.M.P. ; Virasawmy, S. ; Maniam, S.M. ; Cheng, X.X.; Heussler, S.P. ; Bin Mahmooda, S. ; Wu, B.-I.
72009Micro/nanomanufacturing in support of materials scienceJian, L.K. ; Moser, H.O. ; Chen, A. ; Heussler, S.P. ; Liu, G. ; Bin Mahmood, S. ; Kalaiselvi, S.M.P. ; Maniam, S.M. ; Virasawmy, S. ; Ren, Y.P.; Barrett, M.D. ; Dhanapaul, A.L. 
820-Jun-2011Multichannel Fourier-transform interferometry for fast signalsHeussler, S.P. ; Moser, H.O. ; Kalaiselvi, S.M. ; Quan, C.G. ; Tay, C.J. 
91-Apr-2010Multivariate analysis techniques in the forensics investigation of the postblast residues by means of fourier transform-infrared spectroscopyBanas, K. ; Banas, A. ; Moser, H.O. ; Bahou, M. ; Li, W. ; Yang, P. ; Cholewa, M.; Lim, S.K.
102006NanoElectromagnetic metamaterials approaching telecommunications frequenciesCasse, B.D.F. ; Moser, H.O. ; Bahou, M. ; Jian, L.K. ; Gu, P.D. 
11Jun-2005New cryogen-free design for superconducting mini-gap undulatorsHobl, A.; Kubsky, S.; Dölling, D.; Geisler, A.; Komorowski, P.; Krischel, D.; Klein, U.; Rossmanith, R.; Moser, H.O. 
12Jun-2005New soft X-ray facility SINS for surface and nanoscale science at SSLSYu, X. ; Wilhelmi, O. ; Moser, H.O. ; Vidyaraj, S.V. ; Gao, X. ; Wee, A.T.S. ; Nyunt, T.; Qian, H.; Zheng, H.
1315-Mar-2005Non-invasive observation of external and internal deposition during membrane filtration by X-ray microimaging (XMI)Yeo, A.; Yang, P. ; Fane, A.G.; White, T.; Moser, H.O. 
14Jan-2003Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms : EditorialMoser, H.O. 
151-Oct-2007Observation of flow characteristics in a hollow fiber lumen using non-invasive X-ray microimaging (XMI)Chang, S.; Yeo, A.; Fane, A.; Cholewa, M. ; Ping, Y. ; Moser, H. 
16Aug-2006Patterning of two-dimensional photonic crystal structures by nanoimprint lithographyChen, A. ; Wang, B.Z.; Chua, S.J.; Wilhelmi, O. ; Mahmood, S.B. ; Saw, B.T. ; Kong, J.R. ; Moser, H.O. 
172007Phase transformation sequences in as-grown PZN-4.5%PT single crystalsChang, W.S. ; Lim, L.C. ; Yang, P. ; Moser, H.O. ; Wang, F.-T.; Tseng, C.-T.; Tu, C.-S.
182008Phase transformations in annealed PZN-4.5%PT single crystalsLim, L.C. ; Chang, W.S. ; Rajan, K.K. ; Shanthi, M. ; Yang, P. ; Moser, H.O. ; Tu, C.-S.; Wang, F.-T.; Tseng, C.-T.; Bhalla, A.S.; Guo, R.
1910-Nov-2009Post-blast detection of traces of explosives by means of Fourier transform infrared spectroscopyBanas, A. ; Banas, K. ; Bahou, M. ; Moser, H.O. ; Wen, L. ; Yang, P. ; Li, Z.J. ; Cholewa, M. ; Lim, S.K.; Lim, Ch.H.
2013-Feb-2013Propagation of electromagnetic fields in bulk terahertz metamaterials: A combined experimental and theoretical studyAlaee, R.; Menzel, C.; Banas, A. ; Banas, K. ; Xu, S.; Chen, H.; Moser, H.O. ; Lederer, F.; Rockstuhl, C.