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Title: Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source
Authors: Moser, H.O. 
Bahou, M. 
Casse, B.D.F. 
Jian, L.K. 
Yang, P. 
Gao, X. 
Wee, A.T.S. 
Issue Date: Dec-2006
Citation: Moser, H.O., Bahou, M., Casse, B.D.F., Jian, L.K., Yang, P., Gao, X., Wee, A.T.S. (2006-12). Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source. Crystallography Reports 51 (SUPPL. 1) : S170-S182. ScholarBank@NUS Repository.
Abstract: Synchrotron radiation facilities are natural places for nanoscience and technology as they may be used for both micro-and nanomanufacturing and the analytic characterization of nanoscale samples. The Singapore Synchrotron Light Source is conducting work in both fields. Examples given refer to the micro-and nanomanufacturing of the first electromagnetic metamaterials for the THz spectral range, the measurement of thin-film parameters such as thickness, density, and roughness in organic and inorganic nanoscale layer systems via X-ray reflectometry; the study of the atomic structure of the so-called carbon nanomesh that is formed through annealing of a SiC wafer at 1100°C by means of high-resolution X-ray photoemission spectroscopy; and the investigation of the chemical states of nanographite via X-ray absorption spectroscopy. © Nauka/Interperiodica 2006.
Source Title: Crystallography Reports
ISSN: 10637745
DOI: 10.1134/S106377450607025X
Appears in Collections:Staff Publications

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