Please use this identifier to cite or link to this item:
https://doi.org/10.1134/S106377450607025X
Title: | Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source | Authors: | Moser, H.O. Bahou, M. Casse, B.D.F. Jian, L.K. Yang, P. Gao, X. Wee, A.T.S. |
Issue Date: | Dec-2006 | Citation: | Moser, H.O., Bahou, M., Casse, B.D.F., Jian, L.K., Yang, P., Gao, X., Wee, A.T.S. (2006-12). Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source. Crystallography Reports 51 (SUPPL. 1) : S170-S182. ScholarBank@NUS Repository. https://doi.org/10.1134/S106377450607025X | Abstract: | Synchrotron radiation facilities are natural places for nanoscience and technology as they may be used for both micro-and nanomanufacturing and the analytic characterization of nanoscale samples. The Singapore Synchrotron Light Source is conducting work in both fields. Examples given refer to the micro-and nanomanufacturing of the first electromagnetic metamaterials for the THz spectral range, the measurement of thin-film parameters such as thickness, density, and roughness in organic and inorganic nanoscale layer systems via X-ray reflectometry; the study of the atomic structure of the so-called carbon nanomesh that is formed through annealing of a SiC wafer at 1100°C by means of high-resolution X-ray photoemission spectroscopy; and the investigation of the chemical states of nanographite via X-ray absorption spectroscopy. © Nauka/Interperiodica 2006. | Source Title: | Crystallography Reports | URI: | http://scholarbank.nus.edu.sg/handle/10635/113055 | ISSN: | 10637745 | DOI: | 10.1134/S106377450607025X |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.