Please use this identifier to cite or link to this item: https://doi.org/10.1134/S106377450607025X
DC FieldValue
dc.titleMaking and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source
dc.contributor.authorMoser, H.O.
dc.contributor.authorBahou, M.
dc.contributor.authorCasse, B.D.F.
dc.contributor.authorJian, L.K.
dc.contributor.authorYang, P.
dc.contributor.authorGao, X.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-11-28T08:43:46Z
dc.date.available2014-11-28T08:43:46Z
dc.date.issued2006-12
dc.identifier.citationMoser, H.O., Bahou, M., Casse, B.D.F., Jian, L.K., Yang, P., Gao, X., Wee, A.T.S. (2006-12). Making and measuring nanostructures: Nanoscience and technology at the Singapore synchrotron light source. Crystallography Reports 51 (SUPPL. 1) : S170-S182. ScholarBank@NUS Repository. https://doi.org/10.1134/S106377450607025X
dc.identifier.issn10637745
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/113055
dc.description.abstractSynchrotron radiation facilities are natural places for nanoscience and technology as they may be used for both micro-and nanomanufacturing and the analytic characterization of nanoscale samples. The Singapore Synchrotron Light Source is conducting work in both fields. Examples given refer to the micro-and nanomanufacturing of the first electromagnetic metamaterials for the THz spectral range, the measurement of thin-film parameters such as thickness, density, and roughness in organic and inorganic nanoscale layer systems via X-ray reflectometry; the study of the atomic structure of the so-called carbon nanomesh that is formed through annealing of a SiC wafer at 1100°C by means of high-resolution X-ray photoemission spectroscopy; and the investigation of the chemical states of nanographite via X-ray absorption spectroscopy. © Nauka/Interperiodica 2006.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1134/S106377450607025X
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.description.doi10.1134/S106377450607025X
dc.description.sourcetitleCrystallography Reports
dc.description.volume51
dc.description.issueSUPPL. 1
dc.description.pageS170-S182
dc.identifier.isiut000242602800025
Appears in Collections:Staff Publications

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