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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Author:  Ong, C.K.

Results 1-20 of 26 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
11994A novel scanning electron microscope method for the investigation of charge trapping in insulatorsGong, H. ; Ong, C.K. 
21-May-1996A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H. 
3Jan-1996Backscattering factor for KLL Auger yield from film-substrate systemsLee, C.L. ; Kong, K.Y.; Gong, H. ; Ong, C.K. 
41993Charge trapping on different cuts of a single-crystalline α-SiO 2Gong, H. ; Le Gressus, C.; Oh, K.H. ; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. 
5Dec-1995Charging of deformed semicrystalline polymers observed with a scanning electron microscopeGong, H. ; Chooi, K.M.; Ong, C.K. 
61994Classical electron trajectory in scanning electron microscope mirror image methodChen, H.; Gong, H. ; Ong, C.K. 
71994Dependence of charging on crystallographic orientations of an as-grown α-quartzGong, H. ; Taijing, L. ; Ong, C.K. 
81995Determination of charge distribution volume in electron irradiated insulators by scanning electron microscopeChen, H.; Gong, H. ; Ong, C.K. 
91993Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope techniqueOh, K.H. ; Le Gressus, C.; Gong, H. ; Ong, C.K. ; Tan, B.T.G. ; Ding, X.Z.
1017-Feb-1997Discharging behaviour on insulator surfaces in vacuum: A scanning electron microscopy observationGong, H. ; Ong, C.K. 
1127-Oct-1997Dynamics aspects of the charging behaviour of polymers under focused electron beam irradiationOng, C.K. ; Song, Z.G.; Gong, H. 
121994Effect of conjugated bonds on the charging of insulating polymersGong, H. ; Chooi, K.M.; Ong, C.K. 
131997Insulator size effect on electron-irradiated quartzSong, Z.G.; Ong, C.K. ; Gong, H. 
141993Investigation of charging on α-quartz facets by a SEM techniqueGong, H. ; Le Gressus, C.; Oh, K.H. ; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. 
1515-Jul-1998Morphology and magnetic analysis of MnSb films grown by hot-wall epitaxyLow, B.L.; Ong, C.K. ; Han, G.C. ; Gong, H. ; Liew, T.Y.F. ; Tatsuoka, H.; Kuwabara, H.; Yang, Z.
161996New observation of surface pre-breakdown of polymethyl-methacrcylate in vacuum with a scanning electron microscopeGong, H. ; Ong, C.K. 
171995New observation of trapped charge transportation on circularly bound polymethylmethacrylate surfaceGong, H. ; Ong, C.K. ; Le Gressus, C.
181994Oscillation phenomenon in charging/discharging of small solid insulatorsGong, H. ; Ong, C.K. ; Chen, H.; Le Gressus, C.; Blaise, G.
19Mar-1994Present limits to the calculation of auger line intensities for film-substrate systemsLee, C.L. ; Gong, H. ; Ong, C.K. 
20Sep-1997Secondary and backscattered electron yields of polymer surface under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H.