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|Title:||Investigation of charging on α-quartz facets by a SEM technique||Authors:||Gong, H.
Le Gressus, C.
|Issue Date:||1993||Citation:||Gong, H.,Le Gressus, C.,Oh, K.H.,Ding, X.Z.,Ong, C.K.,Tan, B.T.G. (1993). Investigation of charging on α-quartz facets by a SEM technique. Annual Report - Conference on Electrical Insulation and Dielectric Phenomena : 186-190. ScholarBank@NUS Repository.||Abstract:||From a SEM mirror image for the charge potential, electrons trapped on different cuts of an α-quartz are determined. Different charging abilities for the various cuts are observed, and this phenomenon is related to permittivity, defect density and stress of the samples.||Source Title:||Annual Report - Conference on Electrical Insulation and Dielectric Phenomena||URI:||http://scholarbank.nus.edu.sg/handle/10635/98767||ISBN:||0780309669||ISSN:||00849162|
|Appears in Collections:||Staff Publications|
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