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Li Ming-Fu

rp01527

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Full Name
Li Ming-Fu
(not current staff)
Variants
MINGFU, LI
Li, M.-F.
LI, MING FU
MINGFU LI N.
Mingfu, L.
Fu, L.M.
MINGFU LI
Li, M.F.
Li, Ming Fu
Li, M.
Li, M.-f.
 
Main Affiliation
 
Faculty
 
Email
elelimf@nus.edu.sg
 

Publications

Refined By:
Subject:  CMOS

Results 1-9 of 9 (Search time: 0.01 seconds).

Issue DateTitleAuthor(s)
1Dec-2003A New Low Voltage CMOS Transconductor for VHF Filtering ApplicationsZhenying, L.; Li, M.-F. ; Lian, Y. ; Rustagi, S.C.
2Nov-2004Dynamic bias-temperature instability in ultrathin SiO 2 and HfO 2 metal-oxide-semiconductor field effect transistors and its impact on device lifetimeLi, M.F. ; Chen, G.; Shen, C.; Wang, X.P.; Yu, H.Y. ; Yeo, Y.-C. ; Kwong, D.L.
3Jul-2009Flat band voltage control on low Vt metal-gate/high-κ CMOSFETs with small EOT (Invited Paper)Chin, A.; Chang, M.F.; Lin, S.H.; Chen, W.B.; Lee, P.T.; Yeh, F.S.; Liao, C.C.; Li, M.-F. ; Su, N.C.; Wang, S.J.
4Dec-2011Some issues in advanced CMOS gate stack performance and reliabilityLi, M.-F. ; Wang, X.P.; Shen, C.; Yang, J.J.; Chen, J.D. ; Yu, H.Y.; Zhu, C. ; Huang, D.
5Feb-2005Thermally robust TaTbxN metal gate electrode for n-MOSFETs applicationsRen, C.; Yu, H.Y. ; Wang, X.P.; Ma, H.H.H. ; Chan, D.S.H. ; Li, M.-F. ; Yeo, Y.-C. ; Tung, C.H.; Balasubramanian, N.; Huan, A.C.H.; Pan, J.S.; Kwong, D.-L.
6Apr-2005Three-layer laminated metal gate electrodes with tunable work functions for CMOS applicationsBai, W.P.; Bae, S.H.; Wen, H.C.; Mathew, S.; Bera, L.K.; Balasubramanian, N.; Yamada, N.; Li, M.F. ; Kwong, D.-L.
7Mar-2008Understand NBTI mechanism by developing novel measurement techniquesLi, M.-F. ; Huang, D.; Shen, C.; Yang, T.; Liu, W.J.; Liu, Z.
8Apr-2007Wide Vfband Vth tunability for metal-gated MOS devices with HfLaO gate dielectricsWang, X.P.; Yu, H.Y.; Li, M.-F. ; Zhu, C.X. ; Biesemans, S.; Chin, A.; Sun, Y.Y.; Feng, Y.P. ; Lim, A.; Yeo, Y.-C. ; Loh, W.Y.; Lo, G.Q.; Kwong, D.-L.
9Jan-2008Widely tunable work function TaN/Ru stacking layer on HfLaO gate dielectricWang, X.P.; Li, M.-F. ; Yu, H.Y.; Yang, J.J.; Chen, J.D. ; Zhu, C.X. ; Du, A.Y.; Loh, W.Y.; Biesemans, S.; Chin, A.; Lo, G.Q.; Kwong, D.-L.