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Wang Shihua

rp00373

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Full Name
Wang Shihua
(not current staff)
Variants
Wang, S.
Wang, S.H.
 
Main Affiliation
 
Faculty
 
Email
mpewsh@nus.edu.sg
 

Publications

Results 21-38 of 38 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
212005Measurement of transparent coating thickness by the use of white light interferometryLi, M.; Quan, C. ; Tay, C.J. ; Reading, I.; Wang, S. 
2Jan-2006Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometryQuan, C. ; Wang, S.H. ; Tay, C.J. 
3Jun-2003New method for measuring dynamic response of small components by fringe projectionTay, C.J. ; Quan, C. ; Shang, H.M. ; Wu, T.; Wang, S. 
42009Non-destructive evaluation of MEMS components by optical methodsTay, C.J. ; Quan, C. ; Wang, S.H. 
52000Optical fiber fringe projector for micro-componentWang, S.H. ; Tay, C.J. ; Quan, C.G. ; Shang, H.M. 
62006Optical interferometric inspection of surface contour of MEMS-componentsTay, C.J. ; Wang, S.H. ; Quan, C. 
7Jul-2000Optical measurement of Young's modulus of a micro-beamTay, C.J. ; Wang, S.H. ; Quan, C. ; Shang, H.M. 
8May-2005Optical micro-shadowgraph-based method for measuring micro-solderball heightWang, S. ; Quan, C. ; Tay, C.J. 
915-Jul-2004Optimal use of dynamic range of a white light video measurement systemQuan, C. ; Tay, C.J. ; Wu, T.; Wang, S.H. ; Shang, H.M. 
101-Oct-2001Study on deformation of a microphone membrane using multiple-wavelength interferometryQuan, C. ; Tay, C.J. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
11May-2006Study on the use of white light interferometry for multifiber-end surface profile measurementQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.
12Oct-2004Surface roughness investigation of semi-conductor wafersTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, B.L.; Chan, K.C.
13Jun-2000Surface roughness measurement in the submicrometer range using laser scatteringWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
142002Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering modelTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, C.K.
15Dec-2001Using laser scattering for detection of cracks on a microsolderball surfaceWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
162003Vibration measurement of micro-components by fringe projection methodWu, T.; Tay, C. ; Quan, C. ; Wang, S. ; Shang, H.
17Apr-2005Vision-based automatic endface inspection of single-fibre optical connectorsYin, X.; Wang, S. ; Reading, I.
182005Vision-based automatic measurement of endface geometry of single-fiber optical connectorsYin, X.; Wang, S. ; Reading, I.