Lim Sin Leng

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Full Name

Lim Sin Leng

(not current staff)

Variants

Lim, S.L.

Main Affiliation

PHYSICS

Faculty

FAC OF SCIENCE

phylimsl@nus.edu.sg

Other emails

PHYLIMSL@nus.edu.sg

Refined By:

Type: Article

Date Issued: [2000 TO 2009]

Results 1-7 of 7 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	15-Jun-2000	Comparative ab initio and DFT study of neutral aniline oligomers	Lim, S.L. ; Tan, K.L. ; Kang, E.T. ; Chin, W.S.
2	Jun-2000	Formation of Ti/Al ohmic contacts on Si-doped GaN epilayers by low temperature annealing	Tan, L.S. ; Prakash, S. ; Ng, K.M.; Ramam, A. ; Chua, S.J. ; Wee, A.T.S. ; Lim, S.L.
3	Jun-2000	In situ X-ray photoelectron spectroscopy studies of interactions of evaporated metals with electroactive polyaniline films	Ma, Z.H.; Lim, S.L. ; Tan, K.L. ; Li, S.; Kang, E.T.
4	20-May-2000	In situ X-ray photoelectron spectroscopy study of the interactions of evaporated magnesium with polyaniline films	Ma, Z.H.; Lim, S.L. ; Tan, K.L. ; Li, S.; Kang, E.T.
5	2001	Intrinsic redox states of polyaniline studied by high-resolution X-ray photoelectron spectroscopy	Chen, Y.; Kang, E.T. ; Neoh, K.G. ; Lim, S.L. ; Ma, Z.H.; Tan, K.L.
6	2000	Ohmic contact formation on silicon-doped gallium nitride epilayers by low temperature annealing	Prakash, S. ; Tan, L.S. ; Ng, K.M.; Raman, A.; Chua, S.J. ; Wee, A.T.S. ; Lim, S.L.
7	2001	The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profiling	Lau, G.S.; Tok, E.S. ; Wee, A.T.S. ; Liu, R. ; Lim, S.L.