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Lim Sin Leng

rp09022

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Full Name
Lim Sin Leng
(not current staff)
Variants
Lim, S.L.
 
Main Affiliation
 
Faculty
 
Email
phylimsl@nus.edu.sg
 
Other emails
 

Publications

Results 1-12 of 12 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
11999Chemical modification of silicon (100) surface via UV-induced graft polymerizationZhang, J.; Cui, C.Q.; Lim, T.B.; Kang, E.-T. ; Neoh, K.G. ; Lim, S.L. ; Tan, K.L. 
215-Jun-2000Comparative ab initio and DFT study of neutral aniline oligomersLim, S.L. ; Tan, K.L. ; Kang, E.T. ; Chin, W.S. 
315-Aug-1999Epitaxy barium ferrite thin films on LiTaO3 substrateFang, H.C.; Ong, C.K. ; Xu, S.Y. ; Tan, K.L. ; Lim, S.L. ; Li, Y. ; Liu, J.M.
4Jun-2000Formation of Ti/Al ohmic contacts on Si-doped GaN epilayers by low temperature annealingTan, L.S. ; Prakash, S. ; Ng, K.M.; Ramam, A. ; Chua, S.J. ; Wee, A.T.S. ; Lim, S.L. 
5Jun-2000In situ X-ray photoelectron spectroscopy studies of interactions of evaporated metals with electroactive polyaniline filmsMa, Z.H.; Lim, S.L. ; Tan, K.L. ; Li, S.; Kang, E.T. 
620-May-2000In situ X-ray photoelectron spectroscopy study of the interactions of evaporated magnesium with polyaniline filmsMa, Z.H.; Lim, S.L. ; Tan, K.L. ; Li, S.; Kang, E.T. 
71-Sep-1998In situ XPS study of the interactions of evaporated copper atoms with neutral and protonated polyaniline filmsLim, S.L. ; Tan, K.L. ; Kang, E.T. 
815-Feb-1998Interactions of evaporated aluminum atoms with polyaniline films - effects of dopant anion and adsorbed oxygenLim, S.L. ; Tan, K.L. ; Kang, E.T. 
92001Intrinsic redox states of polyaniline studied by high-resolution X-ray photoelectron spectroscopyChen, Y.; Kang, E.T. ; Neoh, K.G. ; Lim, S.L. ; Ma, Z.H.; Tan, K.L. 
102000Ohmic contact formation on silicon-doped gallium nitride epilayers by low temperature annealingPrakash, S. ; Tan, L.S. ; Ng, K.M.; Raman, A.; Chua, S.J. ; Wee, A.T.S. ; Lim, S.L. 
1111-Dec-1997Surface-functionalized polyaniline filmsKang, E.T. ; Neoh, K.G. ; Huang, S.W. ; Lim, S.L. ; Tan, K.L. 
122001The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profilingLau, G.S.; Tok, E.S. ; Wee, A.T.S. ; Liu, R. ; Lim, S.L.