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Huan Cheng Hon,Alfred

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Full Name
Huan Cheng Hon,Alfred
(not current staff)
Variants
Huan, Cha
Huan, A.H.
Huan, C.H.A.
Huan, A.C.H.
Huan, C.H.
Huan, Alfred C.H.
Alfred, C.H.H.
Huan, C.-H.A.
Huan, A.
 
Main Affiliation
 
Faculty
 
Email
phyhuana@nus.edu.sg
 

Publications

Refined By:
Author:  Wee, A.T.S.
Department:  PHYSICS
Department:  INST OF MATERIALS RESEARCH & ENGINEERING

Results 1-10 of 10 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11-Jun-1997AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beamsPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
2Dec-1996AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantationPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
315-Mar-1996Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
415-Dec-1996Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
521-Sep-1997ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
6Nov-1998Atomic force microscopy investigation of the O2 +-induced surface topography of InPPan, J.S. ; Tay, S.T.; Huan, C.H.A. ; Wee, A.T.S. 
7Jul-1998Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAsPan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L. 
81999Synthesis and characterization of Ge nanocrystals immersed in amorphous SiOx matrixJie, Y.X. ; Wu, X. ; Huan, C.H.A. ; Wee, A.T.S. ; Guo, Y. ; Zhang, T.J.; Pan, J.S. ; Chai, J.; Chua, S.J. 
914-Dec-1996XPS studies on nitridation of InP(100) surface by N+ 2 ion beam bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
101999XPS study of incident angle effects on the ion beam modification of InP surfaces by 6 keV O2 +Pan, J.S. ; Tay, S.T.; Huan, C.H.A. ; Wee, A.T.S.