Full Name
Eng Soon Tok
Variants
Tok, E.-S.
Tok, E.
TOK, E.S.T
Tok, Eng Soon
Tok Eng Soon
Soon Tok, E.
Tok E.S.
Tok, E.S.
 
Main Affiliation
 
Faculty
 
Email
phytokes@nus.edu.sg
 

Publications

Refined By:
Author:  Tok, E.S.
Type:  Conference Paper
Author:  Zhang, J.

Results 1-8 of 8 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Apr-2005Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. ; Watt, F. 
2Apr-2003Dynamics and surface segregation during GSMBE of Si1-yCy and Si1-x-yGexCy on the Si(0 0 1) surfacePrice, R.W.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Woods, N.J.; Zhang, J.
314-Feb-2002Growth mechanisms in thin film epitaxy of Si/SiGe from hydridesZhang, J.; Woods, N.J.; Breton, G.; Price, R.W.; Hartell, A.D.; Lau, G.S.; Liu, R. ; Wee, A.T.S. ; Tok, E.S. 
4May-2002High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structuresOsipowicz, T. ; Seng, H.L. ; Wielunski, L.S.; Tok, E.S. ; Breton, G.; Zhang, J.
5Sep-2003High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layersSeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Breese, M.B.H. ; Watt, F. ; Tok, E.S. ; Zhang, J.
6May-2002Optimal geometry for GeSi/Si super-lattice structure RBS investigationWielunski, L.S.; Osipowicz, T. ; Teo, E.J. ; Watt, F. ; Tok, E.S. ; Zhang, J.
7Jul-2001The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)Hartell, A.D.; Tok, E.S. ; Zhang, J.
810-Jun-2003The effects of carbon incorporation during GSMBE of Si1-yCy and Si1-x-yGexCy: Growth dynamics and segregationPrice, R.W.; Tok, E.S. ; Woods, N.J.; Zhang, J.