Loh Wei Yip

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Full Name

Loh Wei Yip

(not current staff)

Variants

Loh, W.Y.
Loh, W.-Y.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

elelwy@nus.edu.sg

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	Issue Date	Title	Author(s)
1	Dec-2004	Charge trapping and breakdown mechanism in HfAlO/TaN gate stack analyzed using carrier separation	Loh, W.-Y. ; Cho, B.J. ; Joo, M.S. ; Li, M.-F. ; Chan, D.S.H. ; Mathew, S.; Kwong, D.-L.
2	8-Jul-2002	Correlation between interface traps and gate oxide leakage current in the direct tunneling regime	Loh, W.Y. ; Cho, B.J. ; Li, M.F.
3	15-Apr-2002	Evolution of quasi-breakdown in thin gate oxides	Loh, W.Y. ; Cho, B.J. ; Li, M.F.
4	May-2002	Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing	Loh, W.Y. ; Cho, B.J. ; Li, M.F.
5	Apr-2003	Localized oxide degradation in ultrathin gate dielectric and its statistical analysis	Loh, W.Y. ; Cho, B.J. ; Li, M.F. ; Chan, D.S.H. ; Ang, C.H.; Zheng, J.Z.; Kwong, D.L.
6	Dec-2007	Tensile-strained germanium CMOS integration on silicon	Zang, H.; Loh, W.Y. ; Ye, J.D.; Lo, G.Q.; Cho, B.J.