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Moser,Herbert Oskar

rp02759

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Full Name
Moser,Herbert Oskar
(not current staff)
Variants
Moser, Herbert Oskar
MOSER, HERBERT O.
Moser, Herbert O
Moser, H.
Moser, H.O.
MOSER, HERBERT OSKAR
 
Main Affiliation
 
Faculty
 
Email
slshom@nus.edu.sg
 

Publications

Results 1-20 of 37 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
121-Dec-2009All-metal self-supported THz metamaterial - The meta-foilMoser, H.O. ; Jian, L.K. ; Chen, H.S.; Bahou, M. ; Kalaiselvi, S.M.P. ; Virasawmy, S. ; Maniam, S.M. ; Cheng, X.X.; Heussler, S.P. ; Mahmood, S.B. ; Wu, B.-I.
2Apr-2007Anneal-induced structural changes of GaIn(N)As/Ga(N)As multiple quantum wells grown by molecular beam epitaxyLiu, H.F. ; Xiang, N. ; Zhou, H.L.; Chua, S.J.; Yang, P. ; Moser, H.O. 
32015Anomalous spectral features of a neutral bilayer grapheneCheng, Mawcheng; Xie, Lanfei ; Pachoud, Alexandre ; Moser, Herbert O ; Chen, Wei ; Wee, Andrew; Castro Neto, Ant�nio H�lio Elio ; Tsuei, Kuding; �zyilmaz, Barbaros 
42009Effects and thermal stability of hydrogen microwave plasma treatment on tetrahedral amorphous carbon films by in situ ultraviolet photoelectron spectroscopyChua, D.H.C. ; Hsieh, J.; Gao, X. ; Qi, D. ; Chen, S. ; Varghese, B. ; Sow, C.H. ; Wee, A.T.S. ; Lu, J.; Loh, K.P. ; Yu, X. ; Moser, H.O. 
525-Apr-2011Experimental characterization of the coherence properties of hard x-ray sourcesPelliccia, D.; Nikulin, A.Y.; Moser, H.O. ; Nugent, K.A.
611-Dec-2001Extreme ultraviolet (EUV) sources for lithography based on synchrotron radiationDattoli, G.; Doria, A.; Gallerano, G.P.; Giannessi, L.; Hesch, K.; Moser, H.O. ; Ottaviani, P.L.; Pellegrin, E.; Rossmanith, R.; Steininger, R.; Saile, V.; Wüst, J.
71-Apr-2006Fabrication and diagnostics of micro/nanodevices by means of synchrotron radiationMoser, H.O. ; Jian, L.K. ; Casse, B.D.F. ; Heussler, S.P. ; Bahou, M. ; Cholewa, M. ; Kong, J.R. ; Saw, B.T. ; Mahmood, S.B. ; Yang, P. 
81-Apr-2006Fabrication of 2D and 3D electromagnetic metamaterials for the terahertz rangeCasse, B.D.F. ; Moser, H.O. ; Jian, L.K. ; Bahou, M. ; Wilhelmi, O.; Saw, B.T. ; Gu, P.D. 
921-Dec-2004Finite-length field error and its compensation in superconducting miniundulatorsMoser, H.O. ; Diao, C.Z. 
101-Sep-2008Free-standing THz electromagnetic metamaterialsMoser, H.O. ; Kong, J.A.; Jian, L.K. ; Chen, H.S.; Liu, G. ; Bahou, M. ; Kalaiselvi, S.M.P. ; Maniam, S.M. ; Cheng, X.X.; Wu, B.I.; Gu, P.D. ; Chen, A. ; Heusslerl, S.P.; Bin Mahmood, S. ; Wen, L. 
11Jul-2007High resolution 3-dimensional tomography with X-rays at Singapore synchrotron light sourceCholewa, M. ; Ping, Y. ; Ling, N.M.; Juan, L.Z. ; Moser, H.O. ; Hwu, Y.; Gureyev, T.E.
121-Aug-2005High-resolution synchrotron X-ray reflectivity study of the density of plasma-treated ultra low-k filmsYang, P. ; Lu, D.; Murthy, B.R.; Moser, H.O. 
13Dec-2004Imaging cells and tissues with refractive index radiologyHwu, Y.; Tsai, W.L.; Chang, H.M.; Yeh, H.I.; Hsu, P.C.; Yang, Y.C.; Su, Y.T.; Tsai, H.L.; Chow, G.M. ; Ho, P.C. ; Li, S.C. ; Moser, H.O. ; Yang, P. ; Seol, S.K.; Kim, C.C.; Je, J.H.; Stefanekova, E.; Groso, A.; Margaritondo, G.
141-Apr-2006Industrial applications of micro/nanofabrication at Singapore Synchrotron Light SourceJian, L.K. ; Casse, B.D.F. ; Heussler, S.P. ; Kong, J.R. ; Saw, B.T. ; Bin Mahmood, S. ; Moser, H.O. 
151-Sep-2002Magnetic field of superconductive in-vacuo undulators in comparison with permanent magnet undulatorsMoser, H.O. ; Rossmanith, R.
1620-Jun-2011Multichannel Fourier-transform interferometry for fast signalsHeussler, S.P. ; Moser, H.O. ; Kalaiselvi, S.M. ; Quan, C.G. ; Tay, C.J. 
171-Apr-2010Multivariate analysis techniques in the forensics investigation of the postblast residues by means of fourier transform-infrared spectroscopyBanas, K. ; Banas, A. ; Moser, H.O. ; Bahou, M. ; Li, W. ; Yang, P. ; Cholewa, M.; Lim, S.K.
1815-Mar-2005Non-invasive observation of external and internal deposition during membrane filtration by X-ray microimaging (XMI)Yeo, A.; Yang, P. ; Fane, A.G.; White, T.; Moser, H.O. 
191-Oct-2007Observation of flow characteristics in a hollow fiber lumen using non-invasive X-ray microimaging (XMI)Chang, S.; Yeo, A.; Fane, A.; Cholewa, M. ; Ping, Y. ; Moser, H. 
202008Phase transformations in annealed PZN-4.5%PT single crystalsLim, L.C. ; Chang, W.S. ; Rajan, K.K. ; Shanthi, M. ; Yang, P. ; Moser, H.O. ; Tu, C.-S.; Wang, F.-T.; Tseng, C.-T.; Bhalla, A.S.; Guo, R.